The 158th AMCP Open Seminar
Development of STEM-based thermal analytical microscopy
Schedules
2021.07.09
Finished
Date & Time
July 9, 2021, 11:00-12:00
Registration
Please apply to RCAMC Office by e-mail.
To:amc=ml.nims.go.jp(Please change "="to "@")
Subject: Registration for the 158th Open Seminar
Deadline:Thursday, July 8,2021 12:00
Online
Please apply by email to the Administration Office by the day before.
※Audio and video recordings are prohibited.
Speaker
KAWAMOTO Naoyuki, Principal Researcher, Electron Microscopy Group
Title
Development of STEM-based thermal analytical microscopy
Abstract
In order to develop advanced thermal conductive, thermally insulating, and thermoelectric materials, it is required to control microstructures of materials and devices on a scale around the mean free path of phonons. It becomes more important to understand the scattering of phonons from a microscopic perspective. Therefore, we have developed a new nanoscale heat transport measurement method that can simultaneously observe microstructures and thermal conductivity by using in-situ transmission electron microscopy (TEM) techniques. We will report the developed STEM-based Thermal Analytical Microscopy (STAM) by combining a local temperature measurement by an assembled nanothermocouple in a TEM with scanning thermal inputs by using STEM beam.
