The 158th AMCP Open Seminar

Development of STEM-based thermal analytical microscopy

Schedules 2021.07.09 Finished


Date & Time

July 9, 2021, 11:00-12:00

Venue

Online(Zoom)

Registration

Please apply to RCAMC Office by e-mail.
To:amc=ml.nims.go.jp(Please change "="to "@")
Subject: Registration for the 158th Open Seminar
Deadline:Thursday, July 8,2021 12:00

Online

Please apply by email to the Administration Office by the day before.
※Audio and video recordings are prohibited.

Speaker

KAWAMOTO Naoyuki, Principal Researcher, Electron Microscopy Group

Title

Development of STEM-based thermal analytical microscopy

Abstract

In order to develop advanced thermal conductive, thermally insulating, and thermoelectric materials, it is required to control microstructures of materials and devices on a scale around the mean free path of phonons. It becomes more important to understand the scattering of phonons from a microscopic perspective. Therefore, we have developed a new nanoscale heat transport measurement method that can simultaneously observe microstructures and thermal conductivity by using in-situ transmission electron microscopy (TEM) techniques. We will report the developed STEM-based Thermal Analytical Microscopy (STAM) by combining a local temperature measurement by an assembled nanothermocouple in a TEM with scanning thermal inputs by using STEM beam.


Summary

Event Title
The 158th AMCP Open Seminar
Development of STEM-based thermal analytical microscopy
Venue
Online(Zoom)
Schedules Hours
2021.07.09
11:00-12:00
Registration Fee
Free

Contact

Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-2839
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
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