Facilities List
Facilities in our unit are listed in 5 categories as belows;
(S/)TEM (Scannning/ Transmission Electron Microscope)
FIB (Focused Ion Beam) / SEM (Scanning Electron Microscope)
Specialized Holders
Other equipments for TEM/SEM samples preparation
Analyses Programs
Structural and elemental analyses at the atomic or nano-scale.
System |
JEM-ARM200F-G (JEOL) |
JEM-ARM300F (JEOL) |
JEM-ARM200F-B (JEOL) |
Spectra Ultra S/TEM (Thermo Fisher Scientific) |
Photo |
|
|
|
|
RMKS |
Sengen-A |
Sengen-B |
Sengen-A |
Sengen-A |
Place |
Sengen-site Materials Reliability Lab. #118 |
Sengen-site Advanced Structural Materials Bldg. #116 |
Sengen-site Fine Processing Lab. #125 |
Sengen-site Physical Analysis Lab. #127 (Operation Desk #105) |
ARIM |
○ |
× |
○ |
× |
NOF |
○ |
× |
○ |
× |
Internal |
○ |
○ |
○ |
○ |
Accel. Voltage |
200, 80 kV |
300, 200, 120, 80 kV |
200, 80, 60 kV |
300, 200, 60, 30 kV |
EDS |
Solid angle 0.26srad |
Dual Type (2×158mm2) |
Dual Type (Solid angle 1.96srad=2×0.98srad) |
Ultra-X (Max. 4.45srad) |
EELS |
GATAN Enfinium |
GATAN ContinuumER |
GATAN Quantum |
Gatan Continuum S |
RMKS |
Electron holography / Tomography |
ASTAR Precession Diffraction |
Electron holography |
Available from July 1st, 2024!! |
Lisence |
A / B |
C |
A / B |
A / B |
System |
Talos F200X G2 (Thermo Fisher Scientific) |
JEM-2800 (JEOL) |
JEM-2100F1 (JEOL) |
JEM-2100F2 (JEOL) |
Photo |
|
|
|
|
RMKS |
Namiki |
Sengen-B |
Sengen-A |
Sengen-A |
Place |
Namiki-site WPI-MANA Bldg. #W-102 |
Sengen-site Advanced Structural Materials Bldg. #115 |
Sengen-site Physical Analysis Lab. #126 |
Sengen-site Physical Analysis Lab. #117 |
ARIM |
× |
× |
○ |
○ |
NOF |
× |
○ |
○ |
○ |
Internal |
○ |
○ |
○ |
○ |
Accel. Voltage |
200, 80 kV |
200 kV |
200, 120, 100 kV |
200 kV |
EDS |
Super-X |
Dual Type (2×100mm2) |
Spot analysis and Elemental mapping |
Spot analysis and Elemental mapping |
EELS |
- |
GATAN QuantumER |
GATAN Enfina |
GATAN Enfina |
RMKS |
Tomography |
ASTAR Precession Diffraction |
STEM: ADF and BF / Tomography |
STEM: ADF and BF |
Lisence |
A / B |
C |
A / B |
A / B |
System |
JEM-2100 (JEOL) |
Photo |
|
RMKS |
Sengen-A |
Place |
Sengen-site Physical Analysis Lab. #119 |
ARIM |
○ |
NOF |
○ |
Internal |
○ |
Accel. Voltage |
200, 160, 120, 100, 80 kV |
EDS |
Spot analysis |
EELS |
- |
RMKS |
- |
Lisence |
A / B |
TEM samples preparation by FIB (or FIB-SEM) systems, or SEM analyses.
System |
Helios 650 (Thermo Fisher Scientific) |
NB5000 (Hitachi High-Tech) |
JIB-4000 (JEOL) |
JEM-9320FIB (JEOL) |
JEM-9310FIB (JEOL) |
Photo |
FIB-SEM dual beam |
FIB-SEM dual beam |
FIB system |
FIB system |
FIB system |
Place |
Sengen-site Physical Analysis Lab. #129 |
Sengen-site Physical Analysis Lab. #129 |
Sengen-site Physical Analysis Lab. #115 |
Sengen-site Physical Analysis Lab. #115 |
Sengen-site Physical Analysis Lab. #212 |
RMKS |
Sengen-A |
Sengen-A |
Sengen-A |
Sengen-A |
Sengen-A |
ARIM |
○ |
○ |
○ |
○ |
○ |
NOF |
○ |
○ |
○ |
○ |
○ |
Internal |
○ |
○ |
○ |
○ |
○ |
Lisence |
A / B |
A / B |
A / B |
A / B |
A / B |
System |
JSM-7000F (JEOL) |
Scios2 (Thermo Fisher Scientific) |
AurigaLaser (CarlZeiss) |
SMF-1000 (Hitachi High-Tech) |
JSM-7900F (JEOL) |
Photo |
SEM system |
FIB-SEM dual beam |
FIB-SEM-Laser |
FIB-SEM-Ar beam |
SEM system |
RMKS |
Sengen-A |
Sengen-B |
Sengen-B |
Sengen-B |
Sengen-B |
Place |
Sengen-site Physical Analysis Lab. #212 |
Sengen-site Advanced Structural Materials Bldg. #108 |
Sengen-site Advanced Structural Materials Bldg. #109 |
Sengen-site Advanced Structural Materials Bldg. #109 |
Sengen-site Advanced Structural Materials Bldg. #208 |
ARIM |
○ |
× |
× |
○ |
× |
NOF |
○ |
○ |
○ |
○ |
○ |
Internal |
○ |
○ |
○ |
○ |
○ |
Lisence |
A / B |
C |
C |
C |
C |
System |
Ethos NX5000 (Hitachi High-Tech) |
TM4000PlusII (Hitachi High-Tech) |
Photo |
FIB-SEM dual beam |
SEM system |
RMKS |
Namiki |
Namiki |
Place |
Namiki-site Quake-Free Lab. #107 |
Namiki-site High Voltage Electron Microscope Lab. #110 |
ARIM |
○ |
○ |
NOF |
○ |
○ |
Internal |
○ |
○ |
Lisence |
A / B |
A / B |
Holder |
Model 636 (Gatan) |
Lightning (DENSsolutions) |
Model 652 (Gatan) |
EM-21311HTR (JEOL) |
Photo |
|
|
|
|
Type |
Double-tilt LN2 cryo TEM holder |
Double-tilt bias and heating TEM holder |
Double tilt heating holder |
High-tilt specimen retainer |
Place |
Sengen-site Physical Analysis Lab. #128 |
Sengen-site Physical Analysis Lab. #128 |
Sengen-site Physical Analysis Lab. #128 |
Sengen-site Physical Analysis Lab. #128 |
Sengen-site (
Usage Guideline of Sample Preparation Room, #103, Physical Analysis Lab. Bldg., Sengen )
ISOMET Low Speed Saw (Buehler)
Model 691 PIPS (Gatan)
Multiprep System (Allied)
Model 656 Dimple Grinder (Gatan)
EM-09100IS (JEOL)
Model 695 PIPS II (Gatan)
EM UC6 (Leica)
Pick-up System
Carbon coater JEC -560 (JEOL)
Osmium coater NL-OPC80A, HPC-1SW
Platinum coater JFC-1600 (JEOL)
Au coater JFC-1500
High clean vacuum coater SVC-700
Ultrasonic Disc Cutter Model 601
Model 682 (Gatan)
* Please bring your own target materials for evaporation source.
Namiki-site
Model 1040 Nanomill (Fischione)
Model 695 PIPS II (Gatan)
Model 656 Dimple Grinder (Gatan)
VES-30T
ML-180 DoctorLap
MS2 MICROSAW (TECHNOORG-LINDA)
Program |
HRTEM Analysis System |
Electron Tomography Analysis System |
DPC analysis System |
Photo |
|
|
|
Overview |
A program for making crystal model and simulation of high resolution image and diffraction pattern. |
A program for tomography analysis. |
A program for analysis of electric and magnetic fields by 4D-STEM. |
Place |
Sengen-site Physical Analysis Lab. #106 |
Sengen-site Physical Analysis Lab. #106 |
Sengen-site Physical Analysis Lab. #106 |
RMKS |
* N/A for ARIM |
|
* N/A for ARIM |