電子顕微鏡ユニット

原子レベル元素分布・構造解析用透過電子顕微鏡
Cs corrected Scanning Transmission Electron Microscope

Spectra Ultra S/TEM (Thermo Fisher Scientific)

千現地区 精密計測実験棟 127&105室 / Sengen-site, Physical Analysis Lab. #127&105

4.45 sradのEDS立体角（分析用二軸傾斜ホルダーでは4.04 sradの立体角）を有するUltra-X検出器を搭載し、加速電圧の切り替え能力により5分以内でレンズと試料ステージを安定状態にできるため、1セッションのなかで材料や観察目的に応じた最適な加速電圧でのS/TEM観察が可能です。

The SpectraUltra system can be operated at different voltages (30 ~ 300 kV) in a single microscopy session, and has a 4.45 srad EDS solid angle (4.04 srad solid angle with an analytical double tilt holder).

 

Specifications
Acc. Voltage 300, 200, 60, 30 kV
Corrector Cs probe corrector S-CORR
EDS Ultra-X (4.04 srad solid angle with an analytical double tilt holder)
EELS Gatan Continuum S/1077 30-300 kV
Detectors 16-segmented Panther STEM detector (BF/DF/HAADF)
DPC/iDPC imaging function
Ceta-S camera (CMOS 4k×4k), 40 fps at 4k×4k

Reservation & Users Policy

    Please follow the session slots below.
  • 9:00~14:00
  • 14:00~19:00
  • 19:00~ (* No time limit until 9:00 the next day)
    • * As a rule, reservations can be made for up to 3 slots.
    * B license: Weekday morning and afternoon sessions available (9:00~19:00).
    * A license: No restrictions on available hours of use.
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