原子レベル元素分布・構造解析用透過電子顕微鏡
Cs corrected Scanning Transmission Electron Microscope
Spectra Ultra S/TEM (Thermo Fisher Scientific)
千現地区 精密計測実験棟 127&105室 / Sengen-site, Physical Analysis Lab. #127&105
4.45 sradのEDS立体角(分析用二軸傾斜ホルダーでは4.04 sradの立体角)を有するUltra-X検出器を搭載し、加速電圧の切り替え能力により5分以内でレンズと試料ステージを安定状態にできるため、1セッションのなかで材料や観察目的に応じた最適な加速電圧でのS/TEM観察が可能です。
The SpectraUltra system can be operated at different voltages (30 ~ 300 kV) in a single microscopy session, and has a 4.45 srad EDS solid angle (4.04 srad solid angle with an analytical double tilt holder).
Specifications |
Acc. Voltage |
300, 200, 60, 30 kV |
Corrector |
Cs probe corrector S-CORR |
EDS |
Ultra-X (4.04 srad solid angle with an analytical double tilt holder) |
EELS |
Gatan Continuum S/1077 30-300 kV |
Detectors |
16-segmented Panther STEM detector (BF/DF/HAADF) DPC/iDPC imaging function Ceta-S camera (CMOS 4k×4k), 40 fps at 4k×4k
|
Published Papers by using Spectra Ultra S/TEM
- "Reversal of Spin-torque Polarity with Inverting Current Vorticity in Composition-graded Layer at the Ti/W Interface", H. Nakayama, T. Horaguchi, J. Uzuhashi, C. He, H. Sukegawa, T. Ohkubo, S. Mitani, K. Yamanoi, and Y. Nozaki, Adv. Electron. Mater., accepted (2025)
- "Impact of GdOx insertion on magnetic anisotropy and damping in double-barrier magnetic stacks", J. Kim, T. Nozaki, J. Uzuhashi, S. Tamaru, T. Ichinose, T. Ochiai, T. Yamamoto, T. Ohkubo, K. Yakushiji and S. Yuasa, APL Mater. 13, 031102 (2025)
- "Development of L10-ordered FePt with low damping and large perpendicular magnetic anisotropy by engineering the nanostructure", P.D. Bentley, Y. Sasaki, I. Suzuki, S. Isogami, Y.K. Takahashi, H. Suto, Appl. Phys. Lett. 126, 022404 (2025)
- "Ultra-low Gilbert damping and self-induced inverse spin Hall effect in GdFeCo thin films", J. Pradhan, M.S. Devapriya, R. Mondal, J. Uzuhashi, T. Ohkubo, S. Kasai, C. Murapaka, A. Haldar, J. Appl. Phys. 136, 203903 (2024)