EM Unit

State-of-the-art electron microscopy equipment and technology

The Electron Microscopy Unit, NIMS, supports a wide range of electron microscopic analyses in various phases of research. The unit provides support for the use of transmission electron microscopes (TEM), scanning electron microscopes (SEM), focused ion beam (FIB) devices, etc., as well as state-of-the-art observation and analysis utilizing special observation techniques.

Researchers outside of NIMS can also access the instruments and technologies of this station through several programs such as Advanced Research Infrastructure for Materials Nanotechnology Japan (ARIM JAPAN) and the NIMS Open Facility.


We are now accepting applications for use in fiscal year 2024. Please check the application procedures before applying. If you have any questions, please contact <tem[at]nims.go.jp>.
  • FY2024 Application Procedures (Internal Use)
  • FY2024 Application Procedures (External Use)
  • Members

    Unit Leader: M. Tanaka
    M. Mitome |  F. Uesugi |  K. Kurashima |  T. Nagai |  T. Moronaga |  I. Koda |  T. Mitsui |  J. Uzuhashi
    and 14 technical staffs, 2 administrative staffs.

    Specialized Field and Support

     We offer a shared-use of transmission electron microscopes, which cover a wide range of functions from a versatile to an advanced high-resolution electron microscopy, and analysis technology.

     We offer a package of techniques to solve problems that have been difficult to observe, for example, samples that are susceptible to electron beam damage, based on the most advanced electron microscopy techniques.

     We offer a package of problem-solving technologies based on state-of-the-art SEM and FIB-SEM electron microscope analysis technologies that specialize in mesoscopic microstructural analysis, such as 3D crystal orientation analysis.