200kV 電界放出形透過電子顕微鏡
200kV Field Emission Transmission Electron Microscope
JEM-2100F2 (JEOL)
初心者にも使いやすい操作画面を備え、TEM、STEM、EELS、 EDS（点 /線分析、元素マッピング）、NBD、CBED など多機能、高分解能を有します。電子線回折図形が撮れるCCDカメラ(Gatan Orius200D) も装備しています。また、3 次元像観察用試料ホルダー及び再構成ソフトを備えています。
The microscope has a user-friendly operation interface. It supports the following modes: TEM, STEM, EELS、EDS,NBD and CBED. It is also equipped with a CCD camera for diffraction pattern. Three-dimensional observation is possible with a dedicated holder and tomography software.
| Specifications | |
|---|---|
| Electron Gun | Schottky field emission gun |
| Acc. Voltage | 200kV |
| Resolution | Point: 0.23 nm, Lattice: 0.10 nm (TEM mode) 0.2 nm (STEM mode) |
| Spherical / Chromatic Aberration | 1.0mm / 1.4mm |
| Sample Tilting Angle | X : ±35°, Y : ±30° |
| Spot Size | 0.5 nm (smallest)for NBD, CBD & EDS |
| Observation/Analysis Functions | STEM: ADF and BF EDS: Spot analysis and Elemental mapping EELS analysis: GATAN Enfina CCD Camera 1: Maximum Pixel Size 2048 × 2048 CCD Camera 2: for Diffraction Pattern, Maximum Pixel Size 2048 × 2048 Special specimen holder: Heating specimen holder; Cooling specimen holder, Tomography specimen holder |
| Images |  多孔質シリカ球の内部構造のTEM-CT観察 TEM-CT observation of mesoporous silica shells. |
