電子顕微鏡解析ステーション ナノ構造解析グループ

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2019.6.6 TEM Station & NIMS Microstructural Characterization Platform Seminar

Title: Characterisation of Materials at FACTS
Speaker: Dr. Crhis Boothroyd (Nanyang Technological University)

Abstract: The facility for analysis, characterisation, testing and simulation (FACTS) hosts scanning electron microscopes, transmission electron microscopes and X-ray diffraction equipment supported by dedicated instrument scientists and is open to all users at NTU. It is open to scientists who are conducting cutting edge research and caters for both expert and casual users. Our scientists also conduct independent research and collaborate with scientists in NTU, other Singapore universities and with researchers abroad.
Our equipment has been used to understand the properties of materials ranging from aerospace alloys to biomaterials, rocks, polymers, quasicrystals and magnetic materials. In this seminar I will give a flavour of some of the many materials analysed by scientists at FACTS and talk about some of the work I have been involved in on cold sprayed alloys and phase-shifting electron holography.

ご興味のある方はぜひ参加登録の上、ご参加ください。Please apply from the Pre-registration Form.
参加希望の方は、下記お申込みフォームより事前登録をお願いします。 〆切は、6/5(水) 正午です。
事前申込のない方の参加申し込みは、セミナー当日会場の受付で行いますので、直接会場までお越し下さい。
Please come directly to the venue after the deadline. (Pre-registration Deadline : 6/5 noon)

 ▶ 事前登録フォーム Pre-registration Form

日時:2019. 6.6(thu)1:30pm~2:30pm(Door open 受付 1:00pm~)
場所:国立研究開発法人 物質・材料研究機構 千現地区 第二会議室
   茨城県つくば市千現1-2-1
   物質・材料研究機構までのアクセス / 入構手続きのご案内はこちらをご覧ください。
   The 2nd conference room, Sengen site, NIMS
   National Institute for Materials Science (NIMS)
   1-2-1 Sengen, Tsukuba, Ibaraki 305-0047
   How to Access → Information
入場無料 Admission Free
※当日受付にてお名前の記入をお願いいたします。
 You will be asked to write your name on a sheet before the Seminar.
Language:英語 English
※講義は英語で行います。1:20 pm までにご入室をお願い致します。
 You are kindly asked to enter the conference room before 1:20p.m.


チラシ

電子顕微鏡ステーション 事務局
掲載日:2019年5月28日