Evaluation of shape and defect structure using cathodoluminescence and electron beam induced current
Group in charge：Semiconductor Defect Design Group
/ CHEN, Jun
Research and development at this center
Methods and technologies
Characterization and measurements
The technologies used at this center can be broadly divided into synthesis/manufacturing technology and evaluation analysis technology.
This page focuses specifically on evaluation and measurement. Please see 【another page 】for synthesis and processing methods.
There are also various ways to evaluate the obtained materials. Methods for investigating crystal and molecular structures, methods for evaluating electrical properties, methods for evaluating optical properties, and spectroscopic analysis for investigating electronic structures and lattice vibrations are also used. In addition, chemical evaluations such as catalytic properties and adsorption properties, as well as methods for investigating mechanical properties such as heat resistance and strength, are also used.
We also have equipment available for use by outside organizations. If you are interested, please inquire.
【Synthesis and fabrication】page is here
Here, techniques for strctural analysis in this center will be introduced.
Scanning electron microscopy
We perform a variety of analyzes by combining scanning electron microscopes with various equipment such as spectrometers.
Transmission electron microscopy
Transmission electron microscopy is used for various structural evaluations such as nano-sized structures and crystal defects.
Probe microscopes
Atomic force microscopy (AFM) is used to evaluate nano-sized surface.
X-ray diffraction
It is used not only to determine crystal structure, but also to evaluate various structures such as thin film thickness and particle size.
Electron beam diffraction
We utilize various electron beam diffraction techniques such as transmission electron microscopy, RHEED, and LEED to identify crystal structures and surface structures.
By analyzing the emission direction of photoelectrons observed using X-ray photoelectron spectroscopy or ultraviolet photoelectron spectroscopy (photoelectron diffraction method), it is also possible to identify the atomic arrangement on the top-most surface and sub-surface
Group in charge：Nano Electronics Device Materials Group
/ YAMASHITA, Yoshiyuki
We will introduce state analysis and composition analysis at this center.
Electron spectroscopy
In particular, we utilize photoelectron spectroscopy, including hard X-ray photoelectron spectroscopy, to evaluate the chemical composition and electronic structure of substances and materials.
Hard x-ray photoelectron spectroscopy
Group in charge：Electro-ceramics group
/ UEDA, Shigenori
Evaluation of crystal defect states
Development of evaluation device: Photothermal deflection spectroscopy
Group in charge：Electro-ceramics Group
/ SUMIYA, Masatomo
Evaluation using isotope tracer
Group in charge：Electro-ceramics group
cathodoluminescence
Group in charge：Semiconductor Defect Design Group
/ CHEN, Jun
We would like to introduce the property evaluation techniques at this center.
Installation of physical property evaluation method
We are developing and implementing property evaluation equipment necessary for material development, such as new measurement equipment that captures quantum phenomena.
Development of equipment for quantum optical measurements
Group in charge：Quantum Photonics Group
/ KURODA, Takashi
ODMR, opticaly detected magnetic resonance
Group in charge：Semiconductor Defect Design Group
/ TERAJI, Tokuyuki / WATANABE, Kenji
Application of data science
We are proceeding with efforts to automate and make our equipment autonomous, with the aim of speeding up substance searches, avoiding missing data and human-related variations, and creating libraries for data utilization.
Development of automatic measurement system
Group in charge：Nano Electronics Device Materials Group
/ YAGYU, Shinjiro
Building a combinatorial smart lab system
Group in charge：Nano Electronics Device Materials Group
/ NAGATA, Takahiro
Introducing calculations and analysis at this center.
Analysis program development
We are developing programs necessary for evaluator analysis of material properties.
Impedance analysis program
Group in charge：Optical Ceramics Group
/ KOBAYASHI, Kiyoshi
Automatic spectrum analysis program
Group in charge：Nano Electronics Device Materials Group
/ YAGYU, Shinjiro
Theory construction
Search for unique nanophotonics functions
Group in charge：Quantum Photonics Group
/ OCHIAI, Tetsuyuki
Mathematical material theory
Group in charge：Semiconductor Defect Design Group
/ INOUE, Junichi
Molecular/crystal simulation
In order to gain a deep understanding of materials, we conduct electronic state calculations based on quantum mechanics and atomic arrangement simulations based on them.
Consideration of natural minerals, nanosheets, etc
Group in charge：Environmental Circulation Composite Materials Group
/ SUEHARA, Shigeru
Search for semiconductors and dielectrics
Group in charge：Electro-ceramics group
/ OHASHI, Naoki
Research Center for Electronic and Optical Materials SITE MAP
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