Nanostructure Analysis Group

T. Sasaki
(Group Leader)
T. Ohkubo

Nanostructure Analysis Group

Multiscale characterization of functional materials using FIB/SEM, (S)TEM, and 3DAP techniques.

  We will perform microstructure analysis of various magnetic materials and devices, including permanent magnets, using a focused ion-beam/scanning electron microscope (FIB/SEM), scanning transmission electron microscope ((S)TEM), and 3D atom probe (3DAP). The group will put a priority on revealing the structure-property relationship to contribute to the acceleration of the materials development by proposing microstructure design strategies to achieve excellent properties, while the group also commits to the development of novel approaches for the microstructure analysis.

Specialized Research Field

  The microstructure is analyzed at multiple scales and in detail using state-of-the-art electron microscopes, such as FIB/SEM and Cs-corrected TEM, and atom probe tomography to reveal structure-property relationships in various magnetic materials, including permanent magnets, spintronic materials, etc.
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