At MANA Foundry Station, we provide the facilities which can use the forefrontive core-technique for materials science researchers who utilize nanotechnology in Japan.

Nano Quantum Foundry is a nano-fabrication center for researches of nanomaterials and nanodevices.There are engineering staffs to support the researchers.

At Beam Station, we are providing a lot of opportunities to the users to access a contract beamline NIMS-BLI5XU(Wide Energy range Beamline for research in Advanced Materials(WEBRAM)) at SPring-8.

The High Voltage Electron Microscopy Station (HVEMS) has been established for the research and development (R&D) of HVEMs and related instrumentation for nano-characterization and study of material systems, and for utilization by users including those who are not specialists of TEM. The focus of the R&D is the dynamic observation of materials on the atomic scale, improvement in spatial resolution, advanced spectroscopic characterization of materials and, development of systems for remote operation and so on.

Belt type HP apparatus

Contact Researcher;

Takashi Taniguchi

Materials synthesis and treatment under high pressure and high temperature.

2000 ton Press : 2 - 10 GPa, 2000°C sample volume: ~1.5 cc.

30000 ton Press: 2 - 6 GPa, 3000°C sample volume: ~7 cc.

Building:

Extreme Technology laboratory, Room:101, Namiki Site

High energy X-ray photoemission spectroscopy and schematic diagram of X-ray optics

Contact Researcher;

Hideki Yoshikawa

Specification

Maximum analyzing energy of photoelectrons is 6 keV. Energy resolution reaches 60 meV under the condition that 6 keV X-rays are monochromatized by Si(333) channel-cut-crystal.

Installation location

SPring-8 NIMS beamline BL15XU

Potential

Owing to long observation depth, high energy XPS is powerful to clarify the electronic structure and chemical bonding of functional devices which have nano-meter-sized layer structures. Moreover, high-resolution valence-band-analysis enables to evaluate the energy level of carriers in electron devices.

High precision powder diffractometer

Contact Researcher;

Hideki Yoshikawa

Specification

Combination of the imaging plate detector and high-brilliant synchrotron radiation X-rays realizes the high precision diffraction pattern of which angular width is 0.003 degree.

Installation location

SPring-8 NIMS beamline BL15XU

Potential

Owing to high throughput measurement, high precision powder X-ray diffractometer with imaging plates is quite useful not only for the structural analysis of complex materials but also for the analysis of the phase transition induced by light illumination, temperature change, electric field, and so on.

High precision powder diffractometer

Contact Researcher;

Kazutaka Mitsuishi at Sakura site

Ultrahigh resolution objective lens : Cs = 2.6 mm, Cc = 3.4 mm

Point resolution : 0.13 nm, Lattice resolution : 0.10 nm

(Capability of dymanic observation with atomic resolution)

High vacuum : below 3×10^-6 Pa around specimen stage

Eucentric side entry stage : more than 40 degree tilt

Heating and cooling : from 10 K to 1073 K

Beam spot : smaller than 10 nm at 400 keV operation

High precision powder diffractometer

Contact Researcher;

Kazutaka Mitsuish iat Sakura site

Ultrahigh resolution objective lens (Cs = 0.7 mm, Cc = 1.2 mm)

Point resolution 0.21 nm & Lattice resolution 0.10 nm

Ultrahigh vacuum below 3×10^-8 Pa around specimen stage

ZrO/W Schottkey FEG providing the fine prove below 0.5 nm in diameter & small energy dispersion about 0.8 eV for EELS

UHV Energy dispersive X-ray spectrometer (UHV EDS)

Pretreatment chamber in which preheating, Deposition, Gas reaction etc. is carried out Cartridge type TEM specimen holders

(Double tilt furnace heating holder, Double tiit resistative heating holder, Single tilt resistative heating holder, Double tilt holder, Single tilt holder)

High precision powder diffractometer

Contact Researcher;

Kazutaka Mitsuishi at Sakura site

Resolution : TEM(Lattice image) 0.14 nm, STEM(lattice image) 0.2 nm, SEI 1.0 nm

Easy operation based on Windows GUI control. BF/DF-STEM, SEI , TEM and SAD are observable.

STEM-EELS is available.

High precision powder diffractometer

Contact Researcher;

Kazutaka Mitsuishi at Sakura site

Acc voltage : (100 keV,200 keV),300 keV

Resolution : Point resolution 0.17 nm, lattice resolution 0.10 nm

Recording :

Multi-scan CCD camera(2k × 2k), imaging plate (IP), video and negative film

Capability :

• High-resolution transmittion electron microscopy(HRTEM)
• Nano-beam electron diffraction(NBED)
• Energy dispersive X-ray spectroscopy(EDS)
• Electron energy loss spectroscopy(EELS) & energy filter imaging(EFI)
• Electron holography

930MHz NMR Magnet

Field: 21.6 T , Bore 54 mm

H Probe HCN Probe

Homogeneity: < 0.1 ppm/10 mmΦ × 20 mm