Atom Probe Tomography Unit | NIMS

Deep UV Laser-Assisted 3D atom probe
Invizo6000 (AMETEK)

Sengen-site, Central Bldg. #531

Atom probe tomography (APT, or 3DAP; three-dimentional atom probe) is the only technique that can visualize the three-dimensional distribution of atoms in materials with nearly atomic spatial resolution and high chemical sensitivity. The "Invizo6000" has an ultra wide field of view owing to new designed flight path and dual-beam deep UV laser pulse system, allowing in a greater analysis volume.

Specifications
Laser System
  • 257.5nm Deep UV Laser-Assisted Field Evaporation
  • Dual-beam Laser Pulsing on the Specimens
    		•
    Flight Path
  • Straight Type
  • Ultra Wide Field of View owing to New Designed Flight Path
    		•
    Publications by using Invizo6000
    2026
    1. "Grain-boundary engineering of Sm(Fe,Co)12-B thin films via boron absorption", J. Uzuhashi, Y. Mori, T. Koyama, T. Abe, Y.K. Takahashi, and T. Shima, Acta Mater. 309, 122098 (2026)
    2. "Spinodal Magnetoresistive Memristors", T. Yamamoto, T. Ichinose, J. Uzuhashi, S. Tsunegi, T. Nozaki, T. Ohkubo, S. Tamaru, K. Yakushiji, H. Kubota, and S. Yuasa, Adv. Funct. Mater. 36, e23154 (2026)
    3. "The Effect of Na and Ag Doping − Alone and in Combination − on SnS1-xSex Nanostructured Thermoelectric Materials", I. Minowa, M. Takahashi, S. Moore, J. Uzuhashi, T. Ohkubo, and S. Maenosono, Sustain. Energy Fuels 10, 1303-1312 (2026)
    2025
    1. "High entropy oxide epitaxial films with interface perpendicular magnetic anisotropy and tunnel magnetoresistance effect toward spintronic applications", R. Sihombing, T. Scheike, J. Uzuhashi, H. Yasufuku, T. Ohkubo, Z. Wen, S. Mitani, and H. Sukegawa, Mater. Today 88, 12-23 (2025)
    2. "Characterization of Precipitates in Cu–Ni–Si Alloys with Different Si Contents by SAXS, SANS, and APT", H. Sasaki, Y. Oba, K. Hiroi, M. Onuma, J. Uzuhashi, and T. Ohkubo, J. Jpn. Inst. Copper 64, 59-64 (2025)