( “Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates” A. Kumar, K. Mitsuishi , T. Hara, K. Kimoto, Y. Irokawa, T. Nabatame, S. Takashima, K. Ueno, M. Edo, Y. Koide; journal : Nanoscale Research Letters [November 11, 2018 Issue (Vol. 13) ]; DOI:
10.1186/s11671-018-2804-y)