A hard X-ray photoelectron analyzer, which can analyze 10 keV photoelectrons, has been installed in the 2nd experimental hutch, in the collaboration with Hiroshima University, JAEA and JASRI. Utilizing a large probing depth of high kinetic energy photoelectrons, the surface contamination effect is drastically reduced. Especially, it is suitable for analysis of samples that have difficulty in surface cleaning. Moreover, this method is powerful to clarify the electronic structure of functional devices which have nanometer-sized layer structures. The distributed beamtime for one experiment is 6 shifts on average.