To investigate the electronic structures of thin solid films, photoelectron spectroscopic experiments using high-brilliant synchrotron X-rays at SPring-8 are available. By the combination of high-resolution X-ray monochrometer and high-resolution hemispherical electron analyzer, high-resolution  photoemission spectroscopic measurements better than 240 meV have been achieved. An automatic sample change is combined with this apparutus. Chemical and electronic states of bulk, surface, and buried interface of solids can be analyzed by this method. The take-off-angle dependence of photoemission spectra enables us to determine depth-dependent electronic states. An available X-ray energy range is 6-10 keV. A bias voltage can be applied to the film sample to perform operando measurements. The measurements can be done at room temperature.