EM Unit

State-of-the-art electron microscopy equipment and technology

The Electron Microscopy Unit, NIMS, supports a wide range of electron microscopic analyses in various phases of research. The unit provides support for the use of transmission electron microscopes (TEM), scanning electron microscopes (SEM), focused ion beam (FIB) devices, etc., as well as state-of-the-art observation and analysis utilizing special observation techniques.

Researchers outside of NIMS can also access the instruments and technologies of this station through several programs such as Advanced Research Infrastructure for Materials Nanotechnology Japan (ARIM JAPAN) and the NIMS Open Facility.

What's New!!

  2025.3.17
We are now accepting applications for use in fiscal year 2025. Please check the application procedures before applying. If you have any questions, please contact <tem[at]nims.go.jp>.
  • FY2025 Application Procedures (Internal Use)
  • FY2025 Application Procedures (External Use)
    •   2024.9.1
    It has become mandatory to include an acknowledgement when presenting results in your papers using shared facilities. See the bottom of this page for details.
      2024.7.1
    Spectra Ultra S/TEM has become available as a shared TEM system. The system can be operated at different voltages (30 ~ 300 kV) in a single microscopy session, and has a 4.45 srad EDS solid angle (4.04 srad solid angle with an analytical double tilt holder).

    Regarding "Acknowledgments" [Important Notice!!] 

    From September 1st, 2024, it has become mandatory to include an acknowledgement when presenting results in your papers using shared facilities. Please refer to the example below.

     ARIM facilities :

    Example: (A part of) This work was supported by "Advanced Research Infrastructure for Materials and Nanotechnology in Japan (ARIM)" of the Ministry of Education, Culture, Sports, Science and Technology (MEXT). Proposal Number JPMXP12xxNMyyyy.

     Non-ARIM facilities :

    Example: (A part of) This work was supported by the Electron Microscopy Unit, National Institute for Materials Science (NIMS).
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