Electron Microscopy Unit | NIMS

日本語 | English
Contact: tem[at]nims.go.jp

State-of-the-art electron microscopy equipment and technology

The Electron Microscopy Unit, NIMS, supports a wide range of electron microscopic analyses in various phases of research. The unit provides support for the use of transmission electron microscopes (TEM), scanning electron microscopes (SEM), focused ion beam (FIB) devices, etc., as well as state-of-the-art observation and analysis utilizing special observation techniques.

Researchers outside of NIMS can also access the instruments and technologies of this station through several programs such as Advanced Research Infrastructure for Materials Nanotechnology Japan (ARIM JAPAN)  and the NIMS Open Facility .

What's New!!

2026.3.16  NEW 
We are now accepting applications for use in fiscal year 2026. Please check the application procedures before applying.
If you have any questions, please contact <tem[at]nims.go.jp>.

2026.2.25
The URL of "Equipment Management System " has been changed from https://www.nmcp.jp/ to https://emu.nims.go.jp/ . If you access the old URL, you will be automatically redirected to the new URL for the time being. However, if you have bookmarked the old URL, please update it to the new URL.

2024.9.1
It has become mandatory to include an acknowledgement when presenting results in your papers using shared facilities. See below for details.

ARIM facilities :
Example: (A part of) This work was supported by "Advanced Research Infrastructure for Materials and Nanotechnology in Japan (ARIM)" of the Ministry of Education, Culture, Sports, Science and Technology (MEXT). Proposal Number JPMXP12xxNMyyyy.

Non-ARIM facilities :
Example: (A part of) This work was supported by the Electron Microscopy Unit, National Institute for Materials Science (NIMS).
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