200kV Transmission Electron Microscope
JEM-2100 (JEOL)
Sengen-site, Physical Analysis Lab. #119This is a user-friendly 200 kV transmission electron microscope with LaB6 Thermal Emission Gun. It supports TEM, EDS (point analysis), and CBED mode. It is also equipped with a CCD camera for diffraction pattern.
| Type of electron gun | LaB6 |
| Acc. Voltage | 200kV (80, 100, 120, 160 kV available) |
| Point / Lattice Resolution | 0.25nm / 0.14nm |
| Spherical / Chromatic Aberration | 1.4mm / 1.8mm |
| Sample Tilting Angle | X : ±42°, Y : ±30° |
| Attachments | EDS: Spot analysis CCD Camera 1: Maximum Pixel Size 4008 × 2672 CCD Camera 2: for Diffraction Pattern, Maximum Pixel Size 2048 × 2048 Special specimen holder: Heating specimen holder; Cooling specimen holder |
| Images |  TEM image (left) and diffraction pattern (right) ofTourmaline (mineral) |