Kresna Bondan FATHONI
Postdoctoral Research Fellow, Spintronics Group,
Research Center for Magnetic and Spintronic Materials
Email: FATHONI.KresnaBondan[at]nims.go.jp


SHORT BIOGRAPHY
Kresna Bondan Fathoni is currently a Postdoctoral Research Fellow in Spintronics Group, at the National Institute for Materials Science (NIMS). He receives his PhD in Materials Science and Engineering from University of Tsukuba in collaboration with NIMS on March 2022. During his study, he discovered metastable bcc-Cu material which has shown world-record performance in epitaxial giant magnetoresistance (GMR) and giant magnetothermal resistance (GMTR) devices. His current research focuses on the development of CoFeB/MgO-based magnetic tunnel junction and many of its iterations such as in-plane, perpendicular or orthogonal-type for various purposes. He specializes in thin film deposition, microfabrication and other advanced characterization techniques. The figure below summarizes his research achievements.


EDUCATION
  • 2019.04 - 2022.03: Materials Science and Engineering, University of Tsukuba
  • 2016.12 - 2019.03: Materials Science, University of Tsukuba
  • 2011.08 - 2015.03: Department of Chemistry, Institut Teknologi Bandung, Indonesia


    • PROFESSIONAL EXPERIENCE
  • 2022.12 - present: Postdoctoral Research Fellow, National Institute for Materials Science, Japan
  • 2022.04 - 2022.11: Academic Quality Assurance, Active Learning Club, Indonesia
  • 2016.12 - 2022.03: NIMS Graduate Research Assistantship fellowship
  • 2015.04 - 2016.12: Laboratory Assistant, Institut Teknologi Bandung, Indonesia


    • RESEARCH INTEREST
  • Spintronics
  • Polycrystalline thin film deposition
  • Magnetic tunnel junctions (MTJs)
  • Device fabrication of magnetic tunnel junction


    • SPECIALIZED TECHNIQUES
  • Thin film deposition: Magnetron Sputtering (DC, RF), Electron-Beam (EB) evaporation
  • Advanced characterization: Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM/MFM), X-Ray Diffraction (XRD, XRR), Field Emission Scanning Electron Microscopy (FE-SEM), Focused-ion beam (FIB), Vibrating Sample Magnetometer (VSM), Magneto-Optic Kerr Effect (MOKE), PPMS-temperature dependent electrical and magnetic measurements
  • Advanced data analysis: Reflection high-energy electron diffraction (RHEED), and transmission electron microscopy (TEM)
  • Microfabrication: Clean room experience, Photolithography, Ion milling

    • Publications, Presentations and Patents
  • Samurai