OLK Festschrift | EDGE2017

Special Issue of Ultramicroscopy

Ondrej Krivanek: A research life in EELS and aberration corrected STEM

Michel Bosman, Gerald Kothleitner: Ondrej Krivanek: A research life in EELS and aberration corrected STEM; DOI: 10.1016/j.ultramic.2016.11.012

A. Howie: New instrumentation and cutting edge research; DOI: 10.1016/j.ultramic.2016.11.006

Christian Colliex: From a physicist's toy to an indispensable analytical tool in many fields of science
A personal view of the leading contribution of Ondrej Krivanek to the spectacular successes of EELS spectroscopy in the electron microscope; DOI: 10.1016/j.ultramic.2016.11.007

John C.H. Spence: Ondrej Krivanek's early scientific research; DOI: 10.1016/j.ultramic.2016.12.006

Ryosuke Senga, Kazu Suenaga: Single-atom detection of light elements: Imaging or spectroscopy?; DOI: 10.1016/j.ultramic.2016.12.007

Richard D. Leapman: Application of EELS and EFTEM to the life sciences enabled by the contributions of Ondrej Krivanek; DOI: 10.1016/j.ultramic.2017.01.002

Sean M. Collins, Paul A. Midgley: Progress and opportunities in EELS and EDS tomography; DOI: 10.1016/j.ultramic.2017.01.003

Juan C. Idrobo, Wu Zhou: A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy; DOI: 10.1016/j.ultramic.2017.02.002

Tracy Lovejoy, Peter Rez, Niklas Dellby: Ondrej Krivanek: A pioneering visionary in electron microscopy; DOI: 10.1016/j.ultramic.2017.02.003

L.J. Allen: Simulation in elemental mapping using aberration-corrected electron microscopy; DOI: 10.1016/j.ultramic.2017.03.001

Philip E. Batson, Maureen J. Lagos: Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correction; DOI: 10.1016/j.ultramic.2017.03.002

T. Mizoguchi, T. Miyata, W. Olovsson: Excitonic, vibrational, and van der Waals interactions in electron energy loss spectroscopy; DOI: 10.1016/j.ultramic.2017.03.003

Jessica A. Alexander, Frank J. Scheltens, Lawrence F. Drummy, Michael F. Durstock, Fredrik S. Hage, Quentin M. Ramasse, David W. McComb: High-resolution monochromated electron energy-loss spectroscopy of organic photovoltaic materials; DOI: 10.1016/j.ultramic.2017.03.004

Toma Susi, Jannik C. Meyer, Jani Kotakoski: Manipulating low-dimensional materials down to the level of single atoms with electron irradiation; DOI: 10.1016/j.ultramic.2017.03.005

Peter A. Crozier: Vibrational and valence aloof beam EELS: A potential tool for nondestructive characterization of nanoparticle surfaces; DOI: 10.1016/j.ultramic.2017.03.011

Hao Yang, Ian MacLaren, Lewys Jones, Gerardo T. Martinez, Martin Simson, Martin Huth, Henning Ryll, Heike Soltau, Ryusuke Sagawa, Yukihito Kondo, Colin Ophus, Peter Ercius, Lei Jin, András Kovács , Peter D. Nellist: Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution; DOI: 10.1016/j.ultramic.2017.02.006

Quentin M. Ramasse: Twenty years after: How "Aberration correction in the STEM" truly placed a "A synchrotron in a Microscope"; DOI: 10.1016/j.ultramic.2017.03.016

Alan J. Craven, Hidetaka Sawada, Sam McFadzean, Ian MacLaren: Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling; DOI: 10.1016/j.ultramic.2017.03.017

R.F. Egerton: Scattering delocalization and radiation damage in STEM-EELS; DOI: 10.1016/j.ultramic.2017.02.007

M. Kociak, A. Gloter, O. Stéphan: A spectromicroscope for nanophysics; DOI: 10.1016/j.ultramic.2017.02.008

Stephen J. Pennycook: The impact of STEM aberration correction on materials science; DOI: 10.1016/j.ultramic.2017.03.020

Koji Kimoto, Kazuo Ishizuka: Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams; DOI: 10.1016/j.ultramic.2017.03.021

Haimei Zheng, Yimei Zhu: Perspectives on in situ electron microscopy; DOI: 10.1016/j.ultramic.2017.03.022