Special Issue of Ultramicroscopy
Ondrej Krivanek: A research life in EELS and aberration corrected STEM
- Michel Bosman, Gerald Kothleitner
- Ondrej Krivanek: A research life in EELS and aberration corrected STEM
- DOI: 10.1016/j.ultramic.2016.11.012
- Christian Colliex
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From a physicist's toy to an indispensable analytical tool in many fields of science
A personal view of the leading contribution of Ondrej Krivanek to the spectacular successes of EELS spectroscopy in the electron microscope - DOI: 10.1016/j.ultramic.2016.11.007
- Ryosuke Senga, Kazu Suenaga
- Single-atom detection of light elements: Imaging or spectroscopy?
- DOI: 10.1016/j.ultramic.2016.12.007
- Richard D. Leapman
- Application of EELS and EFTEM to the life sciences enabled by the contributions of Ondrej Krivanek
- DOI: 10.1016/j.ultramic.2017.01.002
- Sean M. Collins, Paul A. Midgley
- Progress and opportunities in EELS and EDS tomography
- DOI: 10.1016/j.ultramic.2017.01.003
- Juan C. Idrobo, Wu Zhou
- A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy
- DOI: 10.1016/j.ultramic.2017.02.002
- Tracy Lovejoy, Peter Rez, Niklas Dellby
- Ondrej Krivanek: A pioneering visionary in electron microscopy
- DOI: 10.1016/j.ultramic.2017.02.003
- L.J. Allen
- Simulation in elemental mapping using aberration-corrected electron microscopy
- DOI: 10.1016/j.ultramic.2017.03.001
- Philip E. Batson, Maureen J. Lagos
- Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correction
- DOI: 10.1016/j.ultramic.2017.03.002
- T. Mizoguchi, T. Miyata, W. Olovsson
- Excitonic, vibrational, and van der Waals interactions in electron energy loss spectroscopy
- DOI: 10.1016/j.ultramic.2017.03.003
- Jessica A. Alexander, Frank J. Scheltens, Lawrence F. Drummy, Michael F. Durstock, Fredrik S. Hage, Quentin M. Ramasse, David W. McComb
- High-resolution monochromated electron energy-loss spectroscopy of organic photovoltaic materials
- DOI: 10.1016/j.ultramic.2017.03.004
- Toma Susi, Jannik C. Meyer, Jani Kotakoski
- Manipulating low-dimensional materials down to the level of single atoms with electron irradiation
- DOI: 10.1016/j.ultramic.2017.03.005
- Peter A. Crozier
- Vibrational and valence aloof beam EELS: A potential tool for nondestructive characterization of nanoparticle surfaces
- DOI: 10.1016/j.ultramic.2017.03.011
- Hao Yang, Ian MacLaren, Lewys Jones, Gerardo T. Martinez, Martin Simson, Martin Huth, Henning Ryll, Heike Soltau, Ryusuke Sagawa, Yukihito Kondo, Colin Ophus, Peter Ercius, Lei Jin, András Kovács , Peter D. Nellist
- Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution
- DOI: 10.1016/j.ultramic.2017.02.006
- Quentin M. Ramasse
- Twenty years after: How "Aberration correction in the STEM" truly placed a "A synchrotron in a Microscope"
- DOI: 10.1016/j.ultramic.2017.03.016
- Alan J. Craven, Hidetaka Sawada, Sam McFadzean, Ian MacLaren
- Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling
- DOI: 10.1016/j.ultramic.2017.03.017
- R.F. Egerton
- Scattering delocalization and radiation damage in STEM-EELS
- DOI: 10.1016/j.ultramic.2017.02.007
- M. Kociak, A. Gloter, O. Stéphan
- A spectromicroscope for nanophysics
- DOI: 10.1016/j.ultramic.2017.02.008
- Stephen J. Pennycook
- The impact of STEM aberration correction on materials science
- DOI: 10.1016/j.ultramic.2017.03.020
- Koji Kimoto, Kazuo Ishizuka
- Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams
- DOI: 10.1016/j.ultramic.2017.03.021
- Haimei Zheng, Yimei Zhu
- Perspectives on in situ electron microscopy
- DOI: 10.1016/j.ultramic.2017.03.022