Special Issue of Ultramicroscopy

    Ondrej Krivanek: A research life in EELS and aberration corrected STEM

Michel Bosman, Gerald Kothleitner
Ondrej Krivanek: A research life in EELS and aberration corrected STEM
DOI: 10.1016/j.ultramic.2016.11.012
A. Howie
New instrumentation and cutting edge research
DOI: 10.1016/j.ultramic.2016.11.006
Christian Colliex
From a physicist's toy to an indispensable analytical tool in many fields of science
A personal view of the leading contribution of Ondrej Krivanek to the spectacular successes of EELS spectroscopy in the electron microscope
DOI: 10.1016/j.ultramic.2016.11.007
John C.H. Spence
Ondrej Krivanek's early scientific research
DOI: 10.1016/j.ultramic.2016.12.006
Ryosuke Senga, Kazu Suenaga
Single-atom detection of light elements: Imaging or spectroscopy?
DOI: 10.1016/j.ultramic.2016.12.007
Richard D. Leapman
Application of EELS and EFTEM to the life sciences enabled by the contributions of Ondrej Krivanek
DOI: 10.1016/j.ultramic.2017.01.002
Sean M. Collins, Paul A. Midgley
Progress and opportunities in EELS and EDS tomography
DOI: 10.1016/j.ultramic.2017.01.003
Juan C. Idrobo, Wu Zhou
A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy
DOI: 10.1016/j.ultramic.2017.02.002
Tracy Lovejoy, Peter Rez, Niklas Dellby
Ondrej Krivanek: A pioneering visionary in electron microscopy
DOI: 10.1016/j.ultramic.2017.02.003
L.J. Allen
Simulation in elemental mapping using aberration-corrected electron microscopy
DOI: 10.1016/j.ultramic.2017.03.001
Philip E. Batson, Maureen J. Lagos
Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correction
DOI: 10.1016/j.ultramic.2017.03.002
T. Mizoguchi, T. Miyata, W. Olovsson
Excitonic, vibrational, and van der Waals interactions in electron energy loss spectroscopy
DOI: 10.1016/j.ultramic.2017.03.003
Jessica A. Alexander, Frank J. Scheltens, Lawrence F. Drummy, Michael F. Durstock, Fredrik S. Hage, Quentin M. Ramasse, David W. McComb
High-resolution monochromated electron energy-loss spectroscopy of organic photovoltaic materials
DOI: 10.1016/j.ultramic.2017.03.004
Toma Susi, Jannik C. Meyer, Jani Kotakoski
Manipulating low-dimensional materials down to the level of single atoms with electron irradiation
DOI: 10.1016/j.ultramic.2017.03.005
Peter A. Crozier
Vibrational and valence aloof beam EELS: A potential tool for nondestructive characterization of nanoparticle surfaces
DOI: 10.1016/j.ultramic.2017.03.011
Hao Yang, Ian MacLaren, Lewys Jones, Gerardo T. Martinez, Martin Simson, Martin Huth, Henning Ryll, Heike Soltau, Ryusuke Sagawa, Yukihito Kondo, Colin Ophus, Peter Ercius, Lei Jin, András Kovács , Peter D. Nellist
Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution
DOI: 10.1016/j.ultramic.2017.02.006
Quentin M. Ramasse
Twenty years after: How "Aberration correction in the STEM" truly placed a "A synchrotron in a Microscope"
DOI: 10.1016/j.ultramic.2017.03.016
Alan J. Craven, Hidetaka Sawada, Sam McFadzean, Ian MacLaren
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling
DOI: 10.1016/j.ultramic.2017.03.017
R.F. Egerton
Scattering delocalization and radiation damage in STEM-EELS
DOI: 10.1016/j.ultramic.2017.02.007
M. Kociak, A. Gloter, O. Stéphan
A spectromicroscope for nanophysics
DOI: 10.1016/j.ultramic.2017.02.008
Stephen J. Pennycook
The impact of STEM aberration correction on materials science
DOI: 10.1016/j.ultramic.2017.03.020
Koji Kimoto, Kazuo Ishizuka
Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams
DOI: 10.1016/j.ultramic.2017.03.021
Haimei Zheng, Yimei Zhu
Perspectives on in situ electron microscopy
DOI: 10.1016/j.ultramic.2017.03.022