NIMS Award 2024 Winners
The National Institute for Materials Science (NIMS) has selected Prof. Yuichi Ikuhara of the University of Tokyo and Prof. Franz J. Giessibl of the University of Regensburg, Germany as the winners of NIMS Award 2024.
This year’s NIMS Award has been granted to two researchers for their research in the field of Basic Materials Science, the results of which have initiated practical applications and made a significant impact on society. Prof. Yuichi Ikuhara from the University of Tokyo was recognized for his contribution to material interface research through innovations in transmission electron microscopy, and Prof. Franz J. Giessibl from the University of Regensburg was honored for his contribution to nanomaterial research through innovations in non-contact atomic force microscopy.
The NIMS Award Ceremony and Commemorative Lectures will be held on Wednesday, November 6th at the Tsukuba International Congress Center as part of NIMS Award Symposium 2024.
Electron microscopy,
grain boundaries/interfaces
Contribution to material interface research through innovations in transmission electron microscopy
Prof. Yuichi Ikuhara
Distinguished Research Professor
Institute of Engineering Innovation, School of Engineering,
The University of Tokyo
Atomic force microscopy
Contribution to nanomaterial research through innovations in non-contact atomic force microscopy
Prof. Franz J Giessibl
Chair for Quantum Nanoscience
Institute of Experimental and Applied Physics
University of Regensburg, Germany
Research Summary and Impact on the Academic and Industrial Sectors
Prof. Yuichi Ikuhara
[Research achievement title]
Contribution to material interface research through innovations in transmission electron microscopy
[Research summary]
Prof. Yuichi Ikuhara has led the development of high-resolution measurement techniques for atomic structures, electronic states, and dopant elements at grain boundaries and interfaces for many years by developing instruments and methods that expand the potential of material analysis and evaluation methods using transmission electron microscopy (TEM) (1). Also, by combining chemical composition/chemical bonding state measurements through energy dispersive x-ray spectroscopy and electron energy loss spectroscopy(2), and theoretical analysis by first-principles calculations, he established quantitative evaluation methods for grain boundaries, interfaces, and dislocations in materials. Additionally, collaborating with electron microscope manufacturers, he developed a 300kV electron microscope with a new spherical aberration corrector and achieved the world’s highest spatial resolution in scanning transmission electron microscopy (STEM)(3) using annular dark-field imaging(4). He also developed annular bright-field STEM(5), which allows to observe light elements that are difficult to observe by conventional imaging, enabling the observation of hydrogen and lithium. These innovations in electron microscopy techniques and equipment, as well as their application to the analysis of grain boundaries and interfaces, have led to the elucidation of various mechanisms of functional expression in materials such as ceramics, thereby contributing greatly to materials science.[Impact on the academic and industrial sectors]
Prof. Yuichi Ikuhara’s achievements have had significant impacts on materials science from two perspectives: the development of innovative material measurement techniques and equipment using transmission electron microscopy, and the elucidation of grain boundary and interface atomic structures.STEM instruments with the world’s highest spatial resolution and annular bright-field STEM detectors have been commercialized and are used worldwide as innovative electron microscopes and related equipment. Additionally, research applying these innovative electron microscopy techniques to a wide range of materials such as ceramics, batteries, catalysts, semiconductors, and magnetic materials have revealed many new findings into grain boundaries and interfaces, leading to the establishment of design guidelines for new materials and the creation of novel materials.
[Glossary]
(1) Transmission Electron Microscopy (TEM): A microscopy technique where electrons accelerated by high-voltage are irradiated to a thin sample, and then the electrons passing through it form a magnified image. This method provides information on the internal structure and composition of the sample.(2) Electron Energy Loss Spectroscopy: A measurement technique where the energy loss by electrons as they interact with atoms in a sample during passing through the sample is measured. This provides information on the elemental composition, chemical bonding states, and electronic structure of the sample.
(3) Scanning Transmission Electron Microscopy (STEM): A microscopy technique where a finely focused electron beam is scanned across a thin sample, and the electrons passing through it are detected to form a magnified image synchronized with the beam scan. Like TEM, this provides information on the internal structure and composition of the sample.
(4) Annular Dark-Field Imaging: A technique in STEM where an annular detector is used to collect electrons scattered at high angles and form a magnified image. The contrast is generally proportional to the square of the atomic number of the sample.
(5) Annular Bright-Field STEM: A technique in STEM that collect electrons scattered at low (rather than high) angles with an annular detector, forming a magnified image. Unlike annular dark-field imaging, it enables clear observation of light elements.
Prof. Franz J Giessibl
[Research achievement title]
Contribution to nanomaterial research through innovations in non-contact atomic force microscopy
[Research summary]
Prof. Dr. Franz J. Giessibl achieved atomic resolution with non-contact atomic force microscopy (AFM) for the first time in the world in 1995. He then developed the qPlus sensor(1), a self-sensing force sensor originally based on a quartz tuning fork, significantly enhancing the capabilities of non-contact AFM. In non-contact AFM, the probe oscillates near the sample surface and the minute forces between the sample surface and the probe are detected. Compared to the previously-used cantilever sensors, the qPlus sensor has a very high spring constant, enabling it to detect short-range forces with high sensitivity at amplitudes as small as tens of picometers, which was unattainable with cantilever sensors. This has dramatically improved the contrast at the atomic level. Using the self-sensing qPlus sensor, he also developed a scanning probe microscope capable of operating at extremely low temperatures, which is challenging with cantilever sensors, and proposed the necessary theories for high-resolution measurements. He has demonstrated the significance of these developments through numerous studies on nanomaterials.[Impact on the academic and industrial sectors]
Atomic force microscopes utilizing the qPlus sensor developed by Prof. Dr. Franz J. Giessibl have been commercialized and over 500 units have been sold worldwide. The qPlus sensor is incorporated in nearly all atomic force microscopes operating at extremely low temperatures and ultra-high vacuum. The use of these instruments has significantly advanced academic fields of surface science, surface physics, surface chemistry, and the like. Notably, the use of the qPlus sensor has enabled the observation of the internal structure of molecules for the first time, making low-temperature atomic force microscopes equipped with the qPlus sensor essential tools in surface chemistry.[Glossary: Supplemental explanation]
(1) qPlus sensor: In conventional AFM, a cantilever is vibrated, and the changes in its resonance characteristics due to interaction with the sample surface are detected using a laser or similar method to obtain information about the sample surface. On the other hand, the qPlus sensor is a force sensor modified from a watch quartz oscillator (in other words, a force sensor based on a tuning fork quartz oscillator), which unlike a cantilever, enables it to detect changes by itself. It is therefore called a self-sensing force sensor.The spring constant of a cantilever ranges from 0.1 to 100 N/m, whereas the qPlus sensor has a spring constant of 1000 N/m, making it much stiffer. This stiffness allows for smaller amplitudes and makes the qPlus sensor suitable for detecting short-range interaction changes. For example, it can improve the measurement accuracy of interactions that are highly distance-dependent, such as the simultaneous measurement of tunneling currents.
NIMS Award Symposium 2024
NIMS Award Ceremony and Commemorative Lecture
at Tsukuba International Congress Center
November 6th-7th, 2024