Local Electrode Atom Probe Microscope - LEAP5000XS

Local Electrode Atom Probe Microscope - LEAP5000XS

  The LEAP5000XS is a high performance atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of simple and complex structures with atom-by-atom identification and accurate spatial positioning. The system works using the principle of field evaporation, whereby a strong electric field applied to the specimen is sufficient to cause removal of atoms by ionization. Atom removal is triggered either via a voltage or laser pulse applied to the sample. (from the CAMECA's website.)
  Transferring 3DAP samples between FIB-SEM and 3DAP machine kept at low temperature and without air exposure is possible by using VCTM(Vacuum and Cryo Transfer Module).
ThermoFisher DualBeam Helios5UX
with Cryo Stage
VCTM
(Vacuum and Cryo Transfer Module)
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