Nanostructure Analysis Group

  We will perform microstructure analysis of various magnetic materials and devices, including permanent magnets, using a focused ion-beam/scanning electron microscope (FIB/SEM), scanning transmission electron microscope ((S)TEM), and 3D atom probe (3DAP). The group will put a priority on revealing the structure-property relationship to contribute to the acceleration of the materials development by proposing microstructure design strategies to achieve excellent properties, while the group also commits to the development of novel approaches for the microstructure analysis.

  The microstructure is analyzed at multiple scales and in detail using state-of-the-art electron microscopes, such as FIB/SEM and Cs-corrected TEM, and atom probe tomography to reveal structure-property relationships in various magnetic materials, including permanent magnets, spintronic materials, etc.