Events
Completed: VAMAS Special Seminar
2023.12.11 13:45
~ 2023.12.11 14:30

Below are the details of the lecture and its description.
Advanced scanning probe microscopy to characterise semiconductors – an overview of NPL’s capabilities and opportunities for collaboration
Date&Time December 11, 2023 (Monday) 13:45-14:30
Venue Seminar Room 213, 2nd floor, Avanced Structura Materials Building, Sengen-site, National Institute for Materials Science (NIMS)
speaker:Dr. Fernando Castro (National Physical Laboratory, UK)
- Principal Scientist and Head of Science for Materials Metrology
- Metrology for emerging electronic materials, electronic interconnects and magnetic materials
- Former Chair of VAMAS
- Presidential Board member of WMRIF

Dr.Fernando Castro

Conference Scene

Laboratory tour