矢治が”15th International Symposium on Atomic Level Characterizations for New Materials and Devices '24 (ALC '24)”において招待講演を行いました。

YAJI, Koichiro.
Imaging-type spin-resolved photoemission microscopy at NIMS.
15th International Symposium on Atomic Level Characterizations for New Materials and Devices '24 (ALC '24).
2024 招待講演

➡研究成果/学会発表へ