12th BIAMS Conference

12TH INTERNATIONAL WORKSHOP ON BEAM INJECTION ASSESSMENT OF MICROSTRUCTURES IN SEMICONDUCTORS - BIAMS 12
Tsukuba/Japan, June 22-26, 2014

BIAMS12 Scientific Committee

  • J. BARJON
  • Université de Versailles Saint-Quentin-en-Yvelines, France
  • O. Breitenstein
  • MPI of Microstructure Physics, Halle, Germany
  • A. Cavallini　
  • University Bologna, Italy
  • M. Kittler　
  • IHP Frankfurt(Oder) & IHP/BTU Joint Lab Cottbus, Germany
  • S.G. Konnikov
  • Ioffe Institute, St.Petersburg, Russia
  • D. E. Mekki
  • Badji Mokhtar Annaba University, Algeria
  • M.R. Phillips
  • University of Technology, Sydney, Australia
  • J. Piqueras
  • University Complutense, Madrid, Spain
  • T. Sekiguchi
  • National Institute for Materials Science (NIMS), Tsukuba, Japan
  • B. Sieber
  • Université Lille, France
  • N. Tabet
  • Qatar Energy and Environment Research Institute (QEERI), Qatar
  • H. Tomokage
  • Fukuoka University, Japan
  • E. Yakimov
  • Institute of Microelectronics, Chernogolovka, Russia