Materials Data Platform (Dismissed)
Advanced Measurement and Characterization Project (Dismissed)
Electron Microscopy Group
To develop cutting-edge materials and to evaluate the performance of practical materials, it is necessary to know the ultra-fine structure of materials. This research group researches and develops state-of-the-art electron microscopy techniques such as spherical aberration correctors, monochromators, and electron energy loss spectroscopy, and applies these techniques to the evaluation of advanced materials. We are also conducting research and development to enable analysis that is difficult to measure with conventional techniques by modifying our own software and hardware for measurement and analysis. We also actively collaborate with universities and companies to promote research.
Field of Expertise/Research Subjects
There are a variety of materials characterization methods based on electron microscopy techniques. This research group conducts the following studies- Development of electron microscopy with ultra-high spatial resolution using a spherical aberration corrector.
- Nanoscale heat conduction measurements using ultra-small thermocouples in a TEM.
- Single molecule measurement by high resolution TEM.
- Development of ultra-high energy resolution electron energy loss spectroscopy using a monochromator.
- LaB6 nanowire novel electron sources.
- Development of new STEM measurement methods (temperature measurement, high-frequency vibration measurement, differential phase contrast).
- Advanced electron microscopy analysis of Li battery-related materials, thermoelectric materials, organic molecules, polymer-inorganic material interfaces, amorphous and nano materials, etc.
- Development of proprietary TEM/STEM/EELS/4D-STEM measurement and analysis software by Scripting and others.
Group Leader
Group Members
Related files and links
お問い合わせ窓口
Electron Microscopy Group
1-1 Namiki, Tsukuba, Ibaraki, 305-0044 JAPAN
E-Mail:
KIMOTO.Koji=nims.go.jp (Please change "=" to "@")
