Electron Microscopy Unit
The Electron Microscopy Unit supports a wide range of electron microscopic analyses in various phases of research. The unit provides support for the use of transmission electron microscopes (TEM), scanning electron microscopes (SEM), focused ion beam devices (FIB), etc., as well as state-of-the-art observation and analysis utilizing special observation techniques. Researchers outside of NIMS can also access the instruments and technologies of this station through several programs such as Advanced Research Infrastructure for Materials Nanotechnology Japan (ARIM Japan) and the NIMS Open Facility.
Providing state-of-the-art electron microscopy equipment and technology
We offer
- A shared-use of transmission electron microscopes, which cover a wide range of functions from a versatile to an advanced high-resolution electron microscopy, and analysis technology.
- A package of techniques to solve problems that have been difficult to observe, for example, samples that are susceptible to electron beam damage, based on the most advanced electron microscopy techniques.
- A package of problem-solving technologies based on state-of-the-art SEM and FIB-SEM electron microscope analysis technologies that specialize in mesoscopic microstructural analysis, such as 3D crystal orientation analysis.
Providing shared use and support to researchers outside NIMS
Researchers outside NIMS can use state-of-the-art electron microscopes and related equipment.
Technical staff with a wealth of experience and knowledge will fully support your use.
There are two ways to use our facility.
- NIMS Open Facility (NOF)
This is a NIMS proprietary project. The results obtained through the use of this program are not disclosed.
- Advanced Research Infrastructure for Materials and Nanotechnology in Japan (ARIM)
This is a project commissioned by the Ministry of Education, Culture, Sports, Science and Technology. The results obtained from the use of this program will be made public.
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Electron Microscopy Unit
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, JAPAN
E-Mail: tem=nims.go.jp (Please change "=" to "@")