The 288th Special CMSM seminar

Enabling Insightful Analysis for Electronic Applications Using Correlative TEM/APT A Showcase of Analytical Capabilities at EAG Laboratories

Dr. Yimeng Chen
Senior Principal Scientist
Eurofins Nanolab Technologies

Date & Time: 16:00 - 17:00, October 20th (Mon), 2025.
Place: 8th Floor Middle Seminar Room, Main Bldg., Sengen.

Abstract:

Originally applied in metallurgy, Atom Probe Tomography (APT) has evolved into a powerful technique for ceramics and advanced electronic materials. This seminar highlights the expanded capabilities of APT when integrated with complementary Transmission Electron Microscopy (TEM) techniques. The correlative TEM/APT approach enables crystallographic and chemical analysis from the same location, a task that remains technically challenging and impactful. During the seminar, we will introduce the comprehensive service offered by EAG Laboratories, which includes dozens of techniques for materials characterization, surface evaluation, purity assessment. We will focus on SIMS, TEM, and APT comparing their strengths in atomic-scale resolution and chemical sensitivity. Cross-platform application examples will be given to demonstrate how combining these techniques enhances reliability and confidence in structural characterization. Using a novel specimen preparation method, we will showcase several case studies where direct correlative TEM/APT analysis was employed. With deep expertise in electron microscopy and atom probe techniques, EAG Laboratories is committed to delivering high-quality, insightful analytical services.

(Contact)

Tadakatsu Ohkubo, Deputy Director of Research Center for Magnetic and Spintronic Materials (CMSM)
E-mail: OHKUBO.Tadakatsu[at]nims.go.jp