Joint Workshop LANL/NIMS Quantum and Functional Materials and MANA International Symposium 2024


Session 6-2

Title

Nanometric phonon spectroscopy using a monochromated electron microscope

Author's photo

Authors

Jun Kikkawa

Affiliations

Electron Microscopy Group, CBRM, NIMS

URL

https://www.nims.go.jp/AEMG/index.html

Email

kikkawa.jun@nims.go.jp

Abstract

Thermal properties of solids are largely governed by phonons. The measurement and understanding of phonon properties at heterointerfaces and lattice defects at nanometer scales are an important issue for controlling phonon transport in various devices. Using a monochromated electron microscope and electron energy loss spectroscopy (EELS) as shown in Fig. 1 [1, 2], we obtained (i) nanometer-scale phonon dispersion, (ii) phonon mode mapping in a heterojunction (Fig. 2a), and (iii) vibrational mode localized at the heterointerface (Fig. 2b). We also demonstrated (iv) nanometer-scale temperature measurement using EELS and the principle of detail balancing between creation and annihilation of phonons [3]. This thermometry scheme was applied to evaluate (v) the local temperature in a nanowire during Joule heating.

Fig. 1. Principle of phonon measurement using EELS in a monochromated electron microscope [1]. Phonon dispersion is obtained by scattering vector dependent EELS [2].
Fig. 2. (a) Phonon mode mapping in a c-BN/diamond heterojunction and (b) EELS map across the heterointerface showing a localized vibrational mode at the interface (indicated by the arrow).

Reference

  1. J. Kikkawa, et al., Phys. Rev. B 104, L201402 (2021). DOI:10.1103/PhysRevB.104.L201402
  2. J. Kikkawa, et al., Phys. Rev. B 106, 195431 (2022). DOI: 10.1103/PhysRevB.106.195431
  3. J. Kikkawa, et al., Phys. Rev. B 98, 075103 (2018). DOI: 10.1103/PhysRevB.98.075103