Session 2-4

Abstract

Application relevant materials are usually polycrystalline, and one of the major challenges in structural analysis resides in accurately identifying the grain boundary orientation and size distribution over a wide field of view with enough spatial resolution to capture nanometer-sized domains. Four-dimensional scanning transmission electron microscopy (4D-STEM) [1] now enables the fast collection of nano-beam electron diffraction patterns on a two-dimensional array of spatial positions in which various computational analyses can reveal structural variations on a pixel-by-pixel basis over different scales while reducing knock-on damage in samples which have been traditionally very challenging to characterize. In the first part of the presentation, I will showcase our team’s advancements in the field of transmission electron microscopy with an emphasis on understanding effects of strain and defects in low-dimensional materials including the first demonstration of true transmission electron microscopy-based automated orientation mapping [2] and touch on its application in thermal metrology [3]. In the second part of the presentation, I will discuss the role of the Center for Integrated Nanotechnologies, a U.S. Department of Energy Nanoscale Science Research Center, as an international partner in the discovery of new phenomena and development of new devices.