B11：XAFSNanoGREEN Bldg. E-505
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Maker |
Sigray/Canon MJ株式会社 |
|---|---|
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Model |
QuantumLeap |
|
Use for |
Analysis of local structure, electronic state, and coordination environment of electrode materials using X-ray spectroscopy. |
|
Outline |
A laboratory-scale X-ray absorption and fluorescence spectrometer capable of X-ray region (core-electron excitation) measurements such as XANES, EXAFS, and EDXS. |
Specification
|
X-ray source for measurement |
W and Rh targets |
|---|---|
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Brightness |
@6keV 10^6/s(XANSE), 10^7/s(EXAFS) |
|
Diffraction Grating |
Ge(220)， Ge(400)， Ge(440), HOPG(002)，Si(111)m |
|
Detector |
Si, 1030x514Pix |
|
Measurement Range |
2.4–20 keV, |
|
Sample Area |
>40 mm, micro-spot size <100 µm, in-situ/operando analysis possible, 1D/2D mapping |
Notice
- As the software is still under development, please contact us if you wish to use it.
- XAFS measurements are easier to analyze in transmission mode. In transmission measurements, if the sample concentration or thickness is too high, X-rays cannot pass through, making it impossible to compare I₀ and I. If the concentration is too low, I and I₀ become nearly identical, preventing absorption calculation. Very thin samples are also difficult to handle and hard to make uniformly thick. Therefore, the sample should be diluted with light-element boron nitride powder to achieve an appropriate concentration, mixed in a mortar for at least 30 minutes, and then pelletized for measurement.
For calculating the appropriate sample concentration, please refer to this guide.
