A26：TEM/STEMNanoGREEN Bldg. E-105
|
Maker |
JEOL |
|---|---|
|
Model |
JEM-ARM200F（HR） |
|
Use for |
TEM/STEM observation, EELS analysis, EDX analysis |
|
Outline |
The JEM-ARM200F, with a STEM Cs corrector incorporated as standard, and the mechanical and electrical stability enhanced to the utmost limit, achieves an unprecedented STEM-HAADF resolution of 78 pm at 200 ㎸. The cold FEG enables high energy resolution EELS analysis. |
Specification
Electron source
|
Gun type |
Schottky type-Cold Field Emission gun |
|---|---|
|
Accelerating voltage |
60,80,200kV |
Resolution
|
Dark Field mode |
78pm (at 200kV, with cold FEG) |
|---|---|
|
TEM(point resolution) |
190pm (at 200kV )110pm (at 200kv, with TEM Cs-corrector) |
Magnification
|
STEM |
x200 to x150,000,000 |
|---|---|
|
TEM |
x50 to x2,000,000 |
Other
|
Cs-corrector |
Built-in as standard |
|---|---|
|
Detectors |
・EDS |
|
Specimen Holder |
The unexposuring sample tilting holder to ambient air is available. |
Notice
- As this is an ultra-high vacuum instrument, samples containing volatile components that may contaminate the chamber cannot, in principle, be measured. Please consult us in advance regarding such samples. Samples containing sulfides cannot be measured.
