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Every year, the organizing committee of the NC-AFM Conference Series arranges for a possibility to publish results presented at the conference in a high-quality journal. The goal is that the NC-AFM community is provided annually with a collection of papers assembled in one issue that give a comprehensive overview over the current state-of-the-art of this rapidly developing field. Due to the high visibility of these Special Issues in the NC-AFM community, papers published in this series are highly cited.
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In order to continue this tradition and to build on the successes of the Special Issues of the 2011, 2012, and 2013 NC-AFM Conferences (click here for a direct link to the 2011 Special Issue), the participants of the NC-AFM 2014 Conference are invited to publish in the Beilstein Journal of Nanotechnology. This peer-reviewed, open access journal (2012 impact factor: 2.374) publishes high-quality original articles on all aspects of nanoscience and nanotechnology, while offering a unique platform for rapid publication and highest visibility.
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When publishing in the Beilstein Journal of Nanotechnology, there are no fees for authors and readers and no page charges or charges for color — the journal is funded by the Beilstein-Institut, a German non-profit foundation, as a service to the scientific community. Articles submitted to the NC-AFM Special Issue will be published online on an ongoing basis, i.e. no wait once your article has been accepted.
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More details about the aims and scope of the Journal can be found on the Journal's website www.bjnano.org, where you can also find the instructions for authors and a description of the submission process. Articles for the Special Issue can be submitted any time (please indicate in your cover letter that it is for the NC-AFM 2014 Special Issue), but the official deadline is set to Friday, October 3, 2014.
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We cordially invite you to plan ahead and to submit a manuscript once the time has come. Take full advantage of true Open Access publishing to disseminate your results with maximum impact and contribute to progress in the NC-AFM community by sending us your exciting research results.
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Yours sincerely,
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Udo D. Schwarz
Associate Editor, Beilstein Journal of Nanotechnology
Editor NC-AFM 2014 Special Issue -
Mehmet Z. Baykara
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Guest Editor, NC-AFM 2014 Special Issue