Special CMSM Seminar by Dr. David J. Larson, CAMECA Instruments, Inc.

開催日: 2016.11.09 終了


Title: Topics in Atom Probe Tomography
Lecturer: Dr. David J. Larson, CAMECA Instruments, Inc., USA.

Abstract:

 In the last decade, the applicability of atom probe tomography (APT) has undergone a revolution due to: 1) improved specimen preparation innovations, 2) increased field of view due and speed, and 3) re-emergence of the use of lasers to induce pulsed field evaporation. This combination has created challenges for spatial data reconstruction algorithms, which range from the basic algorithm to much more advanced ideas. Due to these advances, a variety of applications have been recently explored using APT (for recent reviews, see). We will review a few of these topics including detection of fine scale precipitates using high detection efficiencies, using electron backscatter diffraction plus APT for the characterisation of grain boundaries, analysis of an off-the-shelf light emitting diode device, analysis of encapsulated Pt nanoparticles, and investigation of microstructure and dating in 4.4 billion year old zircons.

http://www.nims.go.jp/mmu/seminar/225SCMSMS.html


イベント・セミナーデータ

イベント・セミナー名
Special CMSM Seminar by Dr. David J. Larson, CAMECA Instruments, Inc.
会場
千現地区 8階中セミナー室 (811‐812室)
開催日: 時間
2016.11.09

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