NIMS Microstructural Characterization Platform
for advanced nanomaterials, office
E-mail:nmcp[at]nims.go.jp (Replace [at] by @)

SPM

Scanning tunneling microscope with magnet (VLT-STM) Sample preparation facilities: Argon-ion sputter gun, heater (up to 1200 ºC), electron beam evaporator (max. 6 evaporator sources), low-temperature manipulator, field ion microscope for observation of the probe tip.
The STM is designed for achieving atomic resolution in both topographic and spectroscopic modes at low temperature in a high magnetic field.
Operation temperature: 0.4 K (30 hours),4.5 K (6 days), 77 k (10 day)
Magnetic field: 0̃16 T
Vacuum: <10-8 Pa
Equipped with as sputter gun, heaters, evaporators, and a field ion microscope.

(Room 110, Interface Science Laboratories at Sengen)

Low-temperature Scanning Tunneling microscope (LT-STM)

Scanning tunneling microscope for observation of conductive materials placed on a single crystal substrate.
A long WD microscope allows the STM tip to land on a sample smaller than 10μm.
Sample preparation facilities: Argon-ion sputter gun, heater (up to 2000ºC), electron beam evaporator, field ion microscope for observation of the probe tip.
Operation temperature: 2.5 K ~ 40 K, 78 K
Vacuum: <10-8 Pa
(Room 114, Interface Science Laboratories at Sengen)

Environment-Control Frequency-Modulation Scanning Probe Microscope High resolution Frequency-Modulation Scanning Probe Microscope (FM-SPM) with controlled environments including in liquid, in vacuum, in gas-atmosphere, at elevated temperatures, under light irradiation, and so on. It can be used for atomic-scale surface and interface characterization of structures and properties of metals, semiconductors, insulators, polymers, and so on.

(Room 215, Physical Analysis Laboratories at Sengen)