NIMS AWARD SYMPOSIUM 2024 | Abstracts
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No.P3-01Oscar CustanceP3-02Tatsuhiro HiraiP3-03Kewei SunP3-04Donglin LiP3-05Hironobu HayashiP3-06Yuji IsshikiP3-07Masayuki AbeP3-08Ridwan PutrazP3-09Masahiro NakayamaP3-10Nobuyuki IshidaNIMSP3-11Tomoki MisakaP3-12Naoki ShimaP3-13Yuya HattoriP3-14Junya OkazakiP3-15Kazuki MiyataP3-16Masahiro HazeP3-17Yuta OkabeNameNIMSKeio Univ.NIMSNIMSNIMSNIMSOsaka Univ.Hokkaido Univ.Osaka Univ.Osaka Univ.Kanazawa Univ.NIMSThe Univ. of TokyoKanazawa Univ.The Univ. of TokyoKanazawa Univ.Presentation TitleDefect Identifi cation at Confi ned CO2 Islands Using SPMWater Adsorption on the Magnetite surface studied by scanning tunneling microscopyOn-Surface Synthesis of Silicon Incorporated Carbon NanostructuresOn-surface Synthesis of Triaza Triangulene and Its MagnetismOn-surface Synthesis of Azobenzene-linked porphyrinAwardNomineeAffi lication/CompanySynthesis and Characterization of OligoacenesStudying Adsorbates on Rutile TiO2(110) – (1×2) Surface Using Tip-enhanced Raman SpectroscopyUnveiling the Nanomechanical Phenomena in Silicon Thin Film Electrodes by Real-time Bimodal Atomic Force Microscopy Imaging Mechanism of Triboelectric Charging in Fluorine-containing Monolayers Using Amplitudefeedback Frequency Modulated Scanning Force MicroscopyQuantitative Characterization of Built-in Potential Profi le Across GaAs p–n Junctions Using Kelvin Probe Force MicroscopyEFM, KPFM Measurement of Photo-induced Charge Separation on F8T2 Monolayer/ TiO2InterfaceSurface Rsistivity Measurements Using Frequency Modulation Atomic Force Microscopy in Ultrahigh VacuumMeasuring Electronic Structure of Thermoelectric Materials by Scanning Tunneling MicroscopyStructures and Surface Conductivity on Dense Pb Monolayers Formed on Si(111) Studied by Low Ttemperature Scanning Tunneling Microscopy/PotentiometryHigh-speed Subnanoscale-resolution 2D/3D-AFM Imaging of Calcite Dissolution ProcessRole of Steps on Transport Measurements Studied by Scanning Tunneling PotentiometryPreparation and Evaluation of a High-temperature Flame-etched Tungsten Tip for Scanning Probe Microscopy83. Scanning Probe Microscopy

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