Abstract Fig. 1 Pulsed STEM-based thermal analytical microscopyDr. Kawamoto is a principal researcher and a member of the Center for Basic Research on Materials (CBRM) in National Institute for Materials Science (NIMS). He received his Ph.D. in Engineering from Tohoku University, Sendai, Japan. He joined NIMS as a MANA researcher, Tsukuba, Japan, in 2009. His primary research interests are developing in-situ S/TEM measurement method such as nanoscale thermal and electrical transport measurements using probing techniques in S/TEM.44Principal Researcher, Electron Microscopy Group, Center for Basic Research on Materials (CBRM),Thermal energy that goes unused, generated by power plants, industrial processes, automobiles, heating and cooling systems, computers, and domestic waste such as sewage heat, is typically released into the atmosphere. To improve energy recovery and conservation, the development of high- performance materials for thermal conductivity, insulation, composites, and thermoelectric conversion, as well as devices for precise thermal control, has become increasingly important. As we strive to create more advanced materials and devices, precise control of thermal behavior at the mesoscopic scale and understanding of thermal transport mechanisms are becoming essential. This demands new techniques capable of evaluating thermal transport phenomena within specific microscopic areas while simultaneously correlating these phenomena with atomic arrangements, defects, compositions, and other material characteristics.In response to this need, we have developed a novel method for measuring thermal transport within a transmission electron microscope (TEM). This method utilizes our proprietary nanoscale thermocouple temperature sensor, integrated into a two-probe TEM holder. Initially, by combining this temperature sensor with a nano-heating technique that employs focused electron beam irradiation, we developed the STEM-based thermal analytical microscopy (STAM) method. This technique allows for the evaluation of steady-state thermal transport in TEM specimens. More recently, we have further advanced this method by incorporating an electrostatic dose modulator (EDM) from IDES into TEM, which pulses the electron beam as shown in Fig. 1. This advancement has led to the development of a quantitative thermal diffusivity measurement method (Pulsed-STAM), based on the phase analysis of temperature waves propagating through TEM specimen. Details will be presented during the presentation.National Institute for Materials Science (NIMS)Using Thermocouple Probing in Pulsed STEMThermal Transport Measurements Naoyuki KawamotoNIMS Talk: S4-3
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