2 RIKEN SPring-8 Center, Sayo-gun, Hyogo 679-5148, Japan1 International Center for Synchrotron Radiation Innovation Smart, Tohoku University, Abstract Yukio Takahashi is a professor at International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University. His research interests lie in the development of novel coherent X-ray diffraction imaging techniques for characterization of functional materials. He received his PhD degree in engineering from Tohoku University in 2004. After a two-year postdoctoral researcher at RIKEN SPring-8 Center, he became a lecturer at Osaka University in 2007 and an associate professor in 2011. He became a professor at Tohoku University in 2019. He was awarded the MEXT prize for young scientists in 2011, and the Kohra-Sasaki prize of the Japanese Society for Synchrotron Radiation Research in 2024.34Coherent X-ray diffraction imaging (CXDI) is a lensless imaging technique based on the measurement of coherent diffraction patterns and phase retrieval calculation, which can realize high spatial resolution beyond the limitation of lens-based X-ray microscopy. In particular, scanning CXDI, also known as X-ray ptychography, is a technique that is rapidly gaining popularity in synchrotron radiation facilities, allowing micrometer-sized objects to be observed with nanoscale resolution. So far, we have developed a high-resolution and high-sensitivity X-ray ptychography apparatus at SPring-8 [1], and have applied it to nanoscale structural imaging of various samples. X-ray ptychography using multiple energies including the absorption edge of a specific element, which is often referred to as X-ray spectroscopic ptychography, enables us to visualize not only nanoscale structures but also chemical states. So far, we have applied it to the observation of catalysts [2] and battery [3, 4] materials. The 3 GeV high-brilliance synchrotron radiation facility NanoTerasu, which commenced operations in April 2024, provides higher brilliance synchrotron radiation than SPring-8 in both the soft X-ray and tender X-ray regions. We have performed the first experiment of tender X-ray ptychography at NanoTerasu. The coherent diffraction patterns from a micrometer-sized particle of sulfurized polymer were collected, and then the phase image was reconstructed with resolutions of sub-50 nm [5]. In the near future, tender X-ray ptychography with sub-10 nm resolution is anticipated to potentially revolutionize the visualization of nanoscale structures and chemical states in various functional materials composed of light elements.[1] Y. Takahashi et al., Phys. Rev. B 83, article number 214109 (2011).[2] M. Hirose et al., Commun. Chem. 2, 50 (2019).[3] H. Uematsu et al., J. Phys. Chem. Lett. 12, 5781-5788 (2021).[4] M. Abe et al., J. Phys. Chem. C 126, 14047–14057 (2022).[5] N. Ishiguro et al., Appl. Phys. Express 17, article number 052006 (2024).Sendai 980-8577, JapanVisualization of Nanoscale Structures and Chemical StatesYukio Takahashi1,2 by Coherent X-ray Diffraction ImagingInvited Talk: S2-3
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