research through innovations in transmission electron microscopy.Research Acheivement TitleContribution to material interface research through innovations in transmission electron microscopyOutline of Awarded Research AchievementProf. Yuichi Ikuhara has led the development of high-resolution measurement techniques for atomic structures, electronic states, and dopant elements at grain boundaries and interfaces for many years by developing instruments and methods that expand the potential of material analysis and evaluation methods using transmission electron microscopy (TEM) (1). Also, by combining chemical composition/chemical bonding state measurements through energy dispersive x-ray spectroscopy and electron energy loss spectroscopy(2), and theoretical analysis by first-principles calculations, he established quantitative evaluation methods for grain boundaries, interfaces, and dislocations in materials. Additionally, collaborating with electron microscope manufacturers, he developed a 300kV electron microscope with a new spherical aberration corrector and achieved the world’s highest spatial resolution in scanning transmission electron microscopy (STEM) (3) using annular dark-field imaging(4). He also developed annular bright-field STEM(5), which allows to observe light elements that are difficult to observe by conventional imaging, enabling the observation of hydrogen and lithium. These innovations in electron microscopy techniques and equipment, as well as their application to the analysis of grain boundaries and interfaces, have led to the elucidation of various mechanisms of functional expression in materials such as ceramics, thereby contributing greatly to materials science.Ripple Effects of Achievements on Academia and IndustryProf. Yuichi Ikuhara’s achievements have had significant impacts on materials science from two perspectives: the development of innovative material measurement techniques and equipment using transmission electron microscopy, and the elucidation of grain boundary and interface atomic structures.STEM instruments with the world’s highest spatial resolution and annular bright-field STEM detectors have been commercialized and are used worldwide as innovative electron microscopes and related equipment. Additionally, research applying these innovative electron microscopy techniques to a wide range of materials such as ceramics, batteries, catalysts, semiconductors, and magnetic materials have revealed many new findings into grain boundaries and interfaces, leading to the establishment of design guidelines for new materials and the creation of novel materials.1. 2. 3. 4. Annular Dark-Field Imaging: A technique in STEM where an annular detector is used to collect electrons scattered at high angles and form a 5. Annular Bright-Field STEM: A technique in STEM that collect electrons scattered at low (rather than high) angles with an annular detector, 16Professor Yuichi Ikuhara from the University of Tokyo was recognized for his contributions to materials interface Transmission Electron Microscopy (TEM) : A microscopy technique where electrons accelerated by high-voltage are irradiated to a thin sample, and then the electrons passing through it form a magnified image. This method provides information on the internal structure and composition of the sample.Electron Energy Loss Spectroscopy: A measurement technique where the energy loss by electrons as they interact with atoms in a sample during passing through the sample is measured. This provides information on the elemental composition, chemical bonding states, and electronic structure of the sample.Scanning Transmission Electron Microscopy (STEM) : A microscopy technique where a finely focused electron beam is scanned across a thin sample, and the electrons passing through it are detected to form a magnified image synchronized with the beam scan. Like TEM, this provides information on the internal structure and composition of the sample.magnified image. The contrast is generally proportional to the square of the atomic number of the sample.forming a magnified image. Unlike annular dark-field imaging, it enables clear observation of light elements.NIMS Award 2024 WinnerResearch Summary and Impact on the Adacemic and Industrial Sections[Field of Research]Electron microscopy, grain boundaries / interfacesProfessor Yuichi IkuharaInstitute of Engineering Innovation, School of EngineeringThe University of Tokyo, Japan
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