●Spatial resolution ~ 1 nm●Long-term time resolved measurements (~ 1 day)●Temporal resolution ~ 80 ps●Significantly improved operability●Stable laser irradiation on the sample surface●Possible integration into an existing STM system※the optical system can be purchased separatelyE-mail:info@unisoku.co.jpWebsite:https://www.unisoku.com/USM1200 seriespublication list2-4-3 Kasugano, Hirakata, Osaka 573-0131 JapanUSM1600publicationlistSpecifications - 1.7-1.7-7 T vector magnet- RF-STM- Long-term dI/dV measurementUSM1300publicationlistTEL +81-72(858)6456Specifications Specifications - Sample temperature ≦ 1.5 K (when optical shutters closed)- Sample temperature ≦ 1.5 K (when optical shutters closed)- Compatible with AFM measurement- Compatible with AFM measurement- Optical access capabilities by inertial-driven lens stages- Optical access capabilities by inertial-driven lens stages- Time-resolved STM with high spatial resolution- Time-resolved STM with high spatial resolution- Shot noise measurement- Shot noise measurementFinancially supported by JST100Nano-Scale Carrier Dynamics MeasurementsCompact Table-Top Optical SystemWe offer high-end low-temperature SPM systems that customers can use as a paid service.The measurement environments are available for on-site visits or online connections.Service DescriptionAvailable Systems40 mK UHV STMFeel free to contact us about the details!Time-ResolvedSTM SystemTime-ResolvedSTM SystemUNISOKU-WEBUNISOKU-WEBNow acceptingFeature1Feature 2Contact: info@unisoku.co.jpNow accepting1.5 K UHV SPM with Optical AccessDeveloped in collaboration with Prof. Shigekawa group (Univ. of Tsukuba)Developed in collaboration with Prof. Shigekawa group (Univ. of Tsukuba)UNISOKUCo.,Ltd.Time-Resolved Scanning Tunneling Microscopy SystemOn-Site SPM Experimental Service
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