Members
Supervisor Researcher : Dr. Daisuke FUJITA
Keiko ONISHI (Researcher), Mingxiang XU (Research Fellow), Zhanwen XIAO (Research Fellow), Taizo OHGI (Research Fellow), Keiko OKUZAWA, Miwako MITSUHARA, Kimiko KANEYAMA, Masayo KITAHARA, Tsuyako KUMAKURA, Noriko NIORI, Keisuke SAGISAKA (Technical supports)
Dr. Daisuke FUJITA
As a sub-theme of "Active Nano Characterization and Technology" Project started from Oct. 1st of 2001, we aim at development of high resolution scanning tunneling microscopy (STM) with active operations, and establishment of active-nano database consisting of nanomaterials data taken by active nano-characterization techniques. As active operations, advanced physical fields (ultra-low temperature, high magnetic field, extreme high vacuum), stress field, and so on are targeted (Fig.1). By applying the advanced physical fields, it will be possible to clarify the correlation between quantum functions of nanostructures and the applied fields. Besides, we plan to develop in-situ analysis technique to clarify the effects of mechanical stress on electronic and atomic structures of nanomaterials.
Research results in FY2001
Development of Advanced Physical Filed STM
We have designed and developed a new high resolution STM system operable under extreme physical fields (lowest temperature T~350mK, highest magnetic field B~11T, lowest pressure P~10-10Pa) as schematically shown in Fig.2. This system will be a powerful tool to clarify new quantum phenomena hidden in various surface nanostructures at atomic resolution.
Topics : Refer to http://www.nims.go.jp/activenano/ for all research results of Active Nano-Characterization and Technology Project
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