Research Activities
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Overview
High resolution probe
microscopy techniques that can analyze the growth/synthesis mechanism and
functional properties of surface nanostructures under various environments such
as low temperature, high magnetic field, ultrahigh vacuum, stress-strain field
etc. play important roles in nanomaterials research. We are aiming at the development of high resolution probing techniques for surface properties such as three-dimensional morphology, atomic structures, local electronic states, etc.
Merging of nanocharacterization and nanofabrication and quantification
are another targets. By applying the surface nanoprobe techniques to various nanoscale materials, we aims at establishing a technological
basis for advanced nanomaterials research.
Methodology and Originality
With the development of high resolution SPM technologies under extreme
environments such as low temperature, ultrahigh vacuum, high magnetic field,
stress-strain field, high temperature, electric field, etc., we aim at
exploration and clarification of novel properties and functionalities of
nanomaterials.
Project Summary
1. Investigation of the novel properties of reconstructed Si(001) surfaces at Low Temperatures
Phase Manipulation on a reconstructed Si(001) surface at LT |
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Phys. Rev. Lett. 91, 146103 (2003)/Phys. Rev. B, 71, 245319 (2005)
Dopants on a reconstructed Si(001) surface at LT |
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2. Carbon nanosprout precipitation on C-doped Ni(111) surfaces at elevated
temperatures
3. An atomic resolution UHV-STM that applies external tensile stress and strain
Control of Domain Population on Si(100) by Application of External Tensile
Stress
Major Instruments
Low Temperature (0.5K), High Magnetic Field (11T), UHV STM |
Low Temperature (4.2K), UlHV STM |
Variable Temperature UHV SPM |
LT-UHV STM for Tunnel-Electron-Induced Luminescence |
UHV STM that Applies External Tensile Stress and Strain |
Scanning Auger Microscope (SAM) |
Angle-Resolved Photo-Electron Spectrometer |
Magnetron Sputter Deposition Apparatus |
Vacuum Evaporator |
Scanning Probe Microscopes in air environment |