Research Activities



High resolution probe microscopy techniques that can analyze the growth/synthesis mechanism and functional properties of surface nanostructures under various environments such as low temperature, high magnetic field, ultrahigh vacuum, stress-strain field etc. play  important roles in nanomaterials research. We are aiming at the development of high resolution probing techniques for surface properties such as three-dimensional morphology, atomic structures, local electronic states, etc.

@Merging of nanocharacterization and nanofabrication and quantification are another targets. By applying the surface nanoprobe techniques to various nanoscale materials, we aims at establishing a technological basis for advanced nanomaterials research.

@Methodology and Originality

With the development of high resolution SPM technologies under extreme environments such as low temperature, ultrahigh vacuum, high magnetic field, stress-strain field, high temperature, electric field, etc., we aim at exploration and clarification of novel properties and functionalities of nanomaterials.

@Project Summary

1. Investigation of the novel properties of reconstructed Si(001) surfaces at Low Temperatures

Phase Manipulation on a reconstructed Si(001) surface at LT

Phys. Rev. Lett. 91, 146103 (2003)/Phys. Rev. B, 71, 245319 (2005)

Dopants on a reconstructed Si(001) surface at LT

2. Carbon nanosprout precipitation on C-doped Ni(111) surfaces at elevated temperatures

3. An atomic resolution UHV-STM that applies external tensile stress and strain

Control of Domain Population on Si(100) by Application of External Tensile Stress

@Major Instruments

Low Temperature (0.5K), High Magnetic Field (11T), UHV STM
Low Temperature (4.2K), UlHV STM
Variable Temperature UHV SPM
LT-UHV STM for Tunnel-Electron-Induced Luminescence
UHV STM that Applies External Tensile Stress and Strain
Scanning Auger Microscope (SAM)
Angle-Resolved Photo-Electron Spectrometer
Magnetron Sputter Deposition Apparatus
Vacuum Evaporator
Scanning Probe Microscopes in air environment