InGaAs QDs determined from the STM image
N.Liu, H.K.Lyeo, C.K.Shih, M. Oshima, T.Mano and N.Koguchi,
Appl. Phys. Lett.. 80 (2002)
(a) 250nm~80nm STM image of HDE-grown InGaAs QDs acquired at a sample bias of -2.5V (filled states) and a tunneling current of 0.08 nA; (b) zoom-in view of a InGaAs QDs.
(a) Empty state STM image of InGaAs QDs acquired at a sample bias of 2.5V (empty states) and a tunneling current of 0.08 nA; (b) enhanced display of (a) showing individual In atoms; (c) row-by-row In-concentration along the [001] direction of the QDs
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