Multiscale characterization of functional materials.

 To understand the structure-property relationships of magnetic and spintronic materials and their devices, various microscopy techniques are employed and though multiscale characterization of functional materials such as soft/hard magnetic materials, spintronic materials and their devices, semiconductor devices using SEM-FIB, TEM and 3DAP techniques to obtain understanding of structure-property relationships. Keeping state-of-the-art nanostructure analysis techniques, including the development of laser assisted 3DAP.

What's New!!

  2022.05.31
Dr. H. Sepehri-Amin recieved "The 43rd Honda Memorial Young Researcher Award". The award is for his research on high-performance permanent magnets without using rare-elements. Award ceremony was held on May 27th at GakushiKaikan, Tokyo.
  2022.04.01
Dr. Akiko Saito has joined the Magnetic Materials Analysis Group as a Chief Researcher.
  2022.03.15
Dr. T. Sasaki won "The 80th JIM (Japan Institute of Metals and Materials) Meritorious Award".
  2022.03.15
Mr. J. Uzuhashi and Dr. A. Kumar et al. won "The 72nd JIM (Japan Institute of Metals and Materials) Metallography Encouragement Award". The award is for our correlative STEM/APT analysis of Mg implanted GaN semiconductor.
  • Related: A. Kumar, J. Uzuhashi et al., J. Appl. Phys. 126, 235704 (2019).
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