Takahiro Nagata
- Affiliation:
- Nano-Electronics Materials Unit, Semiconductor Device Materials Group
- Specialty:
- Oxide electronics
- Academic degree:
- Ph.D. in Engineering, Osaka Prefecture University, 2003
- Recent publications
- See NIMS Researchers DB
Educational & Research History
| 2011 | - | Present | MANA Scientist, MANA, NIMS |
| 2008 | - | 2009 | Visiting Researcher, University of California, Santa Barbara, USA |
| 2006 | - | 2010 | Researcher, NIMS |
| 2005 | - | 2006 | Postdoctoral Researcher, NIMS |
| 2003 | - | 2005 | Postdoctoral Researcher, Japan Science and Technology Agency (JST) |
| 2003 | Doctor of Engineering, Graduate School of Engineering, Course of Applied Materials Science, Osaka Prefecture University | ||
| 2000 | Master of Engineering, Graduate School of Engineering, Course of Applied Materials Science, Osaka Prefecture University | ||
| 1998 | Bachelor, School of Engineering, Department of Applied Materials Science, Osaka Prefecture University |
Research Interests
- Hetero-interface of oxides
Selected Papers
-
Oxygen migration at Pt/HfO2/Pt interface under bias operation
- Nagata T, Haemori M, Yamashita Y, Iwashita Y, Yoshikawa H, Kobayashi K and Chikyow T
- Applied Physics Letters, Vol. 97, 082902 (2010)
- Study of the Au Schottky contact formation of oxygen plasma treated n-type SnO2 (101) thin films
- Nagata T, Bierwagen O, White M, Tsai M-Y and Speck J
- Journal of Applied Physics, Vol. 107, 033707 (2010)
- Interface structure and the chemical states of Pt film on polar-ZnO single crystal
- Nagata T, Volk J, Haemori M, Yamashita Y, Yoshikawa H, Ueda S, Kobayashi K, Hayakawa R, Yoshitake M and Chikyow T
- Applied Physics Letters, Vol. 94, 221904 (2009)
- GaN Film Fabrication by Near-Atmospheric Plasma-Assisted Chemical Vapor Deposition
- Nagata T, Sakuma Y, Uehara T and Chikyow T
- Japanese Journal of Applied Physics Letter, Vol. 46, L43 - L45 (2007)
- Electro-optic effect in ZnO:Mn thin Films
- Takahiro Nagata, Atsushi Ashida, Norifumi Fujimura and Taichiro Ito
- Journal of Alloys and Compounds, Vol. 371, pp.157-159 (2004)