The 86th AMCP Open Seminar

October 24, 2016, 15:00 – 16:50

National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room  → access

Pre-registration is not required.
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.

1. Dr. Yukinori Taniguchi (Oxford Instruments KK, Asylum Research, Application Group)

2. Dr. Koji Ishii (Oxford Instruments KK, Asylum Research, Application Group) / Mr. Oskar Amster (Prime Nano Inc. Director of Sales & Marketing)

1.  High-resolution and nanomechanical characterization by state-of-the-art AFM

2.  Nanoelectrical characterization by state-of-the-art AFM

1. Atomic force microscopy (AFM) provides high-resolution topographic imaging for various samples with controlled environments, and is commonly used among surface science, devices, and (bio) polymer researchers. Since, beyond topography, “function” such as mechanical and electrical properties can be investigated in nanometer scale, AFM is getting popular to characterize industrial products. Asylum Research has been developing easy-to-use, high-performance AFMs, by introducing new technologies such as photo-thermal cantilever excitation mechanism. Asylum Research offers a variety of complementary AFM techniques in our NanomechPro™ Toolkit. This collection can accurately evaluate a wide range of nanomechanical behavior including elasticity, loss tangent, and adhesive forces. In this seminar, we summarize recent progress in Asylum AFMs.


2. Tablet PC and smart phone markets have been grown for the past few years, also it is necessary to develop semiconductor device and other electronic parts. AFM(Atomic Force Microscopy) is not only used to measure topography and nano-mechanical characterization, but also to detect and make images nano-electrical characterization with conductive probes. Many imaging modes are developed, for instance, c-AFM(conductive AFM) can measure current through sample with bias to sample and SKPM(Scanning Kelvin Probe Force Microscopy) measures surface potential on the sample. Asylum Research has developed unique measurement modes also on nano-electric characterization. In this seminar, advanced imaging modes using Asylum Research AFM are introduced for nano-electrical measurement. PFM(Piezoresponse Force Microscopy) makes image nano ferroelectric domain structure with DART(Dual AC Resonance Tracking). Also this technique has been applied to LIB(Li ion battery). Asylum Research AFMs measure doping concentration of semiconductor materials using sMIM(scanning Microwave Impedance Microscopy), Prime Nano Inc.


* NIMS merely provides an opportunity to join the seminar but does not intend to endorse or recommend anything.