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The 152nd AMCP Open Seminar

Beyond Low energy electron microscopy

Schedules 2020.03.19


Date & Time

March 19, 2020 (Thursday) 16: 00-17: 00

Venue

National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room

Registration

Pre-registration is not required.
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.

Speaker

Prof. Ernst Bauer, Arizona State University

Title

Beyond Low energy electron microscopy (LEEM)

Abstract

While a standard LEEM instrument allows not only LEED but also mirror electron microscopy (MEM), photoemission electron microscopy (PEEM), work function change measurements and other surface science methods, it gives no information on electronic and magnetic structure and only limited information on chemical composition via LEED. The possibilities of obtaining some of this information via Auger electron emission microscopy (AEEM) and X-ray PEEM (XPEEM) was discussed some time before the first LEEM instrument was operating and realized within ten years afterwards by adding an imaging energy filter. Once high brightness synchrotron radiation sources became available XPEEM immediately replaced AEEM and gave also information on the electronic structure. This allows now comprehensive surface and thin film characterization on the 10 nm scale, including magnetic characterization via magnetic dichroism imaging. Parallel to this development spin-polarized LEEM (SPLEEM) was developed, allowing magnetic imaging without photons. Finally, aberration correction was added, pushing the resolution limit to 2 nm. The talk will discuss these developments and illustrate their application with selected results.

General reference: Ernst Bauer, Surface Microscopy with Low Energy Electrons, Springer 2014


Summary

Event Title
The 152nd AMCP Open Seminar
Beyond Low energy electron microscopy
Venue
National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room
Schedules Hours
2020.03.19
16:00-17:00
Registration Fee
Free

Contact

Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-3861/2839
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
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