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The 151st AMCP Open Seminar

From thin film growth modes to low energy electron microscopy

Schedules 2020.02.27


Date & Time

February 27, 2020 (Thursday) 16: 00-17: 00

Venue

National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room

Registration

Pre-registration is not required.
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.

Speaker

Prof. Ernst Bauer, Arizona State University

Title

From thin film growth modes to low energy electron microscopy

Abstract

This talk gives a brief history of the invention of low energy electron microscopy (LEEM) starting from the formulation of the three thin film growth modes (Frank-van der Merwe, Stranski-Krastanov and Volmer-Weber).1 On the long road to LEEM lateral averaging methods such as work function change and thermal desorption methods were applied in addition to LEED to determine the phase and bonding of the growing film to obtain experimental insight in the first two growth modes. As the development of LEEM started2 in the early years of metal ultrahigh vacuum technology many technical problems had to be solved in addition to the transfer of the system to a new location so that this imaging method did not become viable until 25 years later.3

  1. Ernst Bauer, Z. Kristallogr. 110 (1958) 372
  2. E. Bauer, 5th Internat. Congr. Electron Microsc. 1961, D-11
  3. W. Telieps and E. Bauer, Ultramicroscopy 17 (1985), 57


Summary

Event Title
The 151st AMCP Open Seminar
From thin film growth modes to low energy electron microscopy
Venue
National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room
Schedules Hours
2020.02.27
16:00-17:00
Registration Fee
Free

Contact

Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-3861/2839
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
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