The 147th AMCP Open Seminar

Tuesday November 19, 2019, 16:00-17:00

National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room → access

Pre-registration is not required.
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.

YAMANISHI, Junsuke, Institute for Molecular Science

Visualization of minute signals in scanning probe microscopy data by EFA

Scanning probe microscopy is a term expressing technologies that visualize surface characteristics of a sample by scanning probe over the sample and performing spectroscopy.[1] Some of them reach atomic resolution, and the characteristics at the atomic level constituting the sample can be observed. On the other hand, EFA (explolatory factor analysis) is a method of statistical analysis, which has a statistical model that divides obtained data into two types: the common factors and the specific factors.[2] Here, we focused on the fact that signals and noises included in the spectra obtained by measurement can be classified into the common factors and the specific factors, and visualized minute signals using EFA. I will give a presentation that we were able to visualize the minute signals in spectral data of various types of scanning probe microscopy.

[1] Wiesendanger, R., & Roland, W. (1994). Scanning probe microscopy and spectroscopy: methods and applications. Cambridge university press.
[2] Reyment, R. A., & Jvreskog, K. G. (1996). Applied factor analysis in the natural sciences. Cambridge University Press.