The 103rd AMCP Open Seminar
High-Resolution Magnetic Force Microscope, Application to Magnetization Structure Observation
Schedules
2017.07.12
Finished
Date & Time
July 12 (Wed) 2017, 15:00-16:00
Venue
National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room →
access
Registration
Pre-registration is not required.
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.
Speaker
FUTAMOTO Masaaki, Proffesor (Faculty of Science and Engineering, Chuo University)
Title
High-Resolution Magnetic Force Microscope, Application to Magnetization Structure Observation
Abstract
MFM is one of the probe microscopes and is possible to observe the magnetization structures with high spatial resolutions less than 10 nm by scanning a sharp magnetic needle tip on a magnetic sample. After briefly explaining the MFM structure and the improving trend of spatial resolution, developments of magnetic tip technology that gives strong influence on the performance, particularly on the spatial resolution, will be reviewed. Care needs to be paid in handling the magnetic needle tip since the material used for MFM tip is soft and easily deforms upon contact with a sample, and oxidizes under ambient atmosphere, both of which deteriorate the MFM performance. Examples of magnetization structures observed by using lab-made tips will be shown and the possibilities of high-resolution MFM will be briefly discussed.
