Prof. Kazuhiro Hono has been honored as "2016 IFES Fellows" at the 55th International Conference on Atom Probe Tomography & Microscopy.

2016.06.22 Update

(At Gyeongju, South Korea./ June 16th)

 Prof. Kazuhiro Hono, Director of CMSM, has been honored as "2016 IFES Fellows" at the 55th International Conference on Atom Probe Tomography & Microscopy held in Gyeongju, South Korea (June 12-17). 
 
 The honor is for his "key contributions to the growth of atom probe, developments in instrumentation, and broad utilization of the technique to impact the study of magnetic materials and precipitation hardening"(sited from the website of IFES).